{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,18]],"date-time":"2026-06-18T15:52:53Z","timestamp":1781797973559,"version":"3.54.5"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China and the Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["62350710213"],"award-info":[{"award-number":["62350710213"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China and the Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["62175194"],"award-info":[{"award-number":["62175194"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China and the Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["62271370"],"award-info":[{"award-number":["62271370"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China and the Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["QTZX23081"],"award-info":[{"award-number":["QTZX23081"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China and the Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["QTZX23069"],"award-info":[{"award-number":["QTZX23069"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3575976","type":"journal-article","created":{"date-parts":[[2025,6,3]],"date-time":"2025-06-03T17:50:30Z","timestamp":1748973030000},"page":"1-8","source":"Crossref","is-referenced-by-count":3,"title":["A Cyclostationarity-Based Method for Time Interval Error Extraction Without Clock Recovery in SerDes Links"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-9148-7659","authenticated-orcid":false,"given":"Zanyu","family":"Shang","sequence":"first","affiliation":[{"name":"State Key Laboratory of Electromechanical Integrated Manufacturing of High-Performance Electronic Equipment, Xidian University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9042-0284","authenticated-orcid":false,"given":"Xiaolong","family":"Chen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electromechanical Integrated Manufacturing of High-Performance Electronic Equipment, Xidian University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1881-1106","authenticated-orcid":false,"given":"Huiting","family":"Huan","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electromechanical Integrated Manufacturing of High-Performance Electronic Equipment, Xidian University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6558-0718","authenticated-orcid":false,"given":"Xing","family":"Quan","sequence":"additional","affiliation":[{"name":"School of Mechano-Electronic Engineering, Xidian University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6120-2771","authenticated-orcid":false,"given":"Jinsong","family":"Zhan","sequence":"additional","affiliation":[{"name":"School of Mechano-Electronic Engineering, Xidian University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-7136-7849","authenticated-orcid":false,"given":"Shuoyan","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Mechano-Electronic Engineering, Xidian University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/i2mtc.2013.6555592"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/mim.2022.9693455"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/mim.2019.8782200"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2016.2610138"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tsipi.2023.3264961"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2017.2711738"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3242005"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2006.883852"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2021.9364950"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/mdt.2004.34"},{"key":"ref11","volume-title":"Precision jitter analysis using the agilent 86100C DCA-J","year":"2017"},{"key":"ref12","article-title":"Comparison of different jitter analysis techniques with a precision jitter transmitter","volume-title":"Keysight Technol","author":"Stephens"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2009.2025992"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2011.2163325"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/temc.2018.2821680"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2003.812916"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2018.2806022"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/app11177988"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/EMCEurope51680.2022.9901014"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/2366\/1\/012045"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/tcom.1987.1096820"},{"key":"ref22","volume-title":"Separation of random and deterministic components of jitter","author":"Stephens","year":"2006"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/lcomm.2022.3187560"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11023066.pdf?arnumber=11023066","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T06:00:40Z","timestamp":1751090440000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11023066\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3575976","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}