{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,25]],"date-time":"2026-03-25T19:24:33Z","timestamp":1774466673260,"version":"3.50.1"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Win2Wal Program through the Service Public de Wallonie (SPW)-Recherche Department of the R\u00e9gion Wallonne","award":["2110062"],"award-info":[{"award-number":["2110062"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3576013","type":"journal-article","created":{"date-parts":[[2025,6,3]],"date-time":"2025-06-03T17:50:30Z","timestamp":1748973030000},"page":"1-12","source":"Crossref","is-referenced-by-count":2,"title":["Reducing Parasitic Oscillations of Capacitive Dividers Using Coaxial Symmetry in the Low-Voltage Arm"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-3297-0000","authenticated-orcid":false,"given":"Thor","family":"Wens","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering and Computer Science (Montefiore Research Unit), Université de Liège, Liège, Belgium"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8898-0298","authenticated-orcid":false,"given":"Jean-Fran\u00e7ois","family":"Fagnard","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Computer Science (Montefiore Research Unit), Université de Liège, Liège, Belgium"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2756-5741","authenticated-orcid":false,"given":"Philippe","family":"Laurent","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Computer Science (Montefiore Research Unit), Université de Liège, Liège, Belgium"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-4609-4228","authenticated-orcid":false,"given":"Christophe","family":"Greffe","sequence":"additional","affiliation":[{"name":"GeneriX SRL, Angleur, Belgium"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1436-7116","authenticated-orcid":false,"given":"Philippe","family":"Vanderbemden","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Computer Science (Montefiore Research Unit), Université de Liège, Liège, Belgium"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/ma16041693"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/en16062741"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1134\/S0021894419030222"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1155\/2014\/980913"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1968.4313725"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.1967.4313607"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3014034"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2064410"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2016.2530841"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2360804"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-00378-8_6"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2007.911124"},{"key":"ref13","first-page":"111","volume-title":"Test & Measurement Catalog","year":"1998"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/PPC.2011.6191436"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/1.3690906"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2510551"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.5050276"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2882260"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1134\/S0020441220020074"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/en15020451"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/PowerTech55446.2023.10202702"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1063\/1.1136120"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICHVE61955.2024.10676098"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/PPC.2005.300571"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1063\/5.0165176"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3063499"},{"key":"ref27","first-page":"138","article-title":"Cabling","volume-title":"Noise Reduction Techniques in Electronic Systems","author":"Ott","year":"1988"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.59161\/jcgmgum-1-2023"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1134\/S1063784207120122"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3045186"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.elstat.2010.10.002"},{"key":"ref32","volume-title":"Damival-Polyurethane Resin","year":"2021"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2010.2046337"},{"key":"ref34","volume-title":"The Megger Guide to Insulating Oil Dielectric Breakdown Test.","year":"2013"},{"issue":"12","key":"ref35","first-page":"413","article-title":"The equivalence of triangles and three-pointed stars in conducting networks","volume":"34","author":"Kennelly","year":"1899","journal-title":"Electr. World Eng."}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11021614.pdf?arnumber=11021614","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,13]],"date-time":"2025-06-13T05:23:35Z","timestamp":1749792215000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11021614\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":35,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3576013","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}