{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,22]],"date-time":"2026-04-22T14:43:16Z","timestamp":1776868996658,"version":"3.51.2"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Beijing Key Research Fund","award":["L241011"],"award-info":[{"award-number":["L241011"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3577843","type":"journal-article","created":{"date-parts":[[2025,6,17]],"date-time":"2025-06-17T13:39:53Z","timestamp":1750167593000},"page":"1-18","source":"Crossref","is-referenced-by-count":20,"title":["OAIFAN: A Noise-Robust Discriminative Feature Unification Framework for Cross-Speed Fault Transfer Diagnosis"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-3227-2054","authenticated-orcid":false,"given":"Yuhan","family":"Huang","sequence":"first","affiliation":[{"name":"School of Mechatronics Engineering, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5702-1281","authenticated-orcid":false,"given":"Xiaoxi","family":"Hu","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Advanced Rail Autonomous Operation, Beijing Jiaotong University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1403-5314","authenticated-orcid":false,"given":"Huan","family":"Wang","sequence":"additional","affiliation":[{"name":"Department of Industrial Engineering, Tsinghua University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6156-3507","authenticated-orcid":false,"given":"Yiming","family":"He","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Digital Manufacturing Equipment and Technology, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-4217-2973","authenticated-orcid":false,"given":"Jingming","family":"Cao","sequence":"additional","affiliation":[{"name":"School of Automation and Intelligence, Beijing Jiaotong University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ITSC57777.2023.10422266"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3322485"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3554906"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3244237"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3116309"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2023.3322417"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2024.108678"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.110074"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CIEEC54735.2022.9846015"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3364263"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2023.110098"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2024.102278"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2898619"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3154000"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2024.104194"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3330139"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3228005"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/electronics9020323"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3345400"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.109848"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2014.03.004"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1177\/1687814020941953"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2024.111200"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3326439"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/CCDC.2019.8832990"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1186\/s10033-023-00838-0"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3183548"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.mechmachtheory.2020.104047"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2021.106974"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.109884"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2013.274"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/3582078"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2994310"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3088489"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2992829"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2025.111057"},{"key":"ref37","volume-title":"HIT-SM Bearing Datasets","year":"2022"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.46298\/dmtcs.12644"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11037765.pdf?arnumber=11037765","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,11]],"date-time":"2025-07-11T05:16:01Z","timestamp":1752210961000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11037765\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":38,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3577843","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}