{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,3]],"date-time":"2026-07-03T17:02:18Z","timestamp":1783098138879,"version":"3.54.6"},"reference-count":19,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62303335"],"award-info":[{"award-number":["62303335"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52075349"],"award-info":[{"award-number":["52075349"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Sichuan Science and Technology Program","award":["23NSFSC3797"],"award-info":[{"award-number":["23NSFSC3797"]}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3579841","type":"journal-article","created":{"date-parts":[[2025,6,16]],"date-time":"2025-06-16T14:57:36Z","timestamp":1750085856000},"page":"1-11","source":"Crossref","is-referenced-by-count":2,"title":["Vehicle Trajectory Extraction From Weak and Discontinuous Quasi-Static DAS Signals Using a Multiscale Context Pix2pix"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8323-3234","authenticated-orcid":false,"given":"Fei","family":"Peng","sequence":"first","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-9991-4644","authenticated-orcid":false,"given":"Gan","family":"Jiang","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-5184-6156","authenticated-orcid":false,"given":"Binbo","family":"Xiong","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-3589-6746","authenticated-orcid":false,"given":"Ziyuan","family":"Xiong","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-5829-1733","authenticated-orcid":false,"given":"Tianyu","family":"Hu","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4375-0149","authenticated-orcid":false,"given":"Yujie","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5040-8299","authenticated-orcid":false,"given":"Jun","family":"Zhong","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8879-7266","authenticated-orcid":false,"given":"Qiang","family":"Miao","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Sichuan University, Chengdu, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3428610"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3289544"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3201938"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.29026\/oea.2021.200078"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/s22031033"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2016.2612060"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2019.2962334"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2022.3219369"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2022.3223084"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2023.3322355"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1002\/stc.3067"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2022.3203482"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2022.3199742"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3308239"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JLT.2023.3337664"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/s23063127"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/3596254"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tgrs.2024.3371052"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2017.632"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11037398.pdf?arnumber=11037398","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,10]],"date-time":"2025-07-10T05:11:54Z","timestamp":1752124314000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11037398\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3579841","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}