{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,13]],"date-time":"2026-05-13T17:40:52Z","timestamp":1778694052233,"version":"3.51.4"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52077167"],"award-info":[{"award-number":["52077167"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3579848","type":"journal-article","created":{"date-parts":[[2025,6,16]],"date-time":"2025-06-16T18:57:36Z","timestamp":1750100256000},"page":"1-11","source":"Crossref","is-referenced-by-count":2,"title":["Identifiability Improvement for Minor Defect in Cables Using FMCW and Adaptive Density-Based Clustering"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-7100-3780","authenticated-orcid":false,"given":"Binjiang","family":"Wang","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, Shaanxi, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3595-5646","authenticated-orcid":false,"given":"Shurong","family":"Li","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, Shaanxi, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2339-8659","authenticated-orcid":false,"given":"Jia","family":"Peng","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, Shaanxi, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7625-6649","authenticated-orcid":false,"given":"Junbo","family":"Deng","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Xi’an Jiaotong University, Xi’an, Shaanxi, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-3707-7931","authenticated-orcid":false,"given":"Xuefeng","family":"Zhao","sequence":"additional","affiliation":[{"name":"Electric Power Research Institute, State Grid Shaanxi Electric Power Company Ltd., Xi’an, Shaanxi, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-1356-7572","authenticated-orcid":false,"given":"Haofei","family":"Sun","sequence":"additional","affiliation":[{"name":"Electric Power Research Institute, State Grid Shaanxi Electric Power Company Ltd., Xi’an, Shaanxi, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/eej.22384"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tdei.2015.004799"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tdei.2018.007344"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tdei.2008.4543121"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tpas.1982.317481"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2005.858964"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2005.858115"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/icosp.2014.7014992"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ichve49031.2020.9279584"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/temc.2022.3213351"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3343831"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.egyr.2023.01.066"},{"issue":"9","key":"ref13","first-page":"4152","article-title":"Location accuracy improvement research for high impedance fault of long-distance cable based on frequency modulated continuous wave","volume":"50","author":"Li","year":"2024","journal-title":"High Voltage Eng."},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2024.3374401"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2021.3139426"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tdei.2021.009578"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.4236\/jemaa.2009.14042"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/s22166086"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/tdei.2022.3173512"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3778\/j.issn.1002-8331.1809-0018"},{"key":"ref21","first-page":"428","article-title":"A comparison of document clustering techniques","volume-title":"Proc. TextMining Workshop KDD","author":"Steinbach"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/312129.312186"},{"key":"ref23","volume-title":"The ESRI Guide to GIS Analysis, Volume 2: Spartial Measurements and Statistics","year":"2024"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.cageo.2007.07.010"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/1217299.1217303"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11037223.pdf?arnumber=11037223","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,28]],"date-time":"2025-06-28T06:18:21Z","timestamp":1751091501000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11037223\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3579848","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}