{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,23]],"date-time":"2026-10-23T20:21:01Z","timestamp":1792786861260,"version":"4.5.0"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2023YFB3107400"],"award-info":[{"award-number":["2023YFB3107400"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62222307"],"award-info":[{"award-number":["62222307"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004608","name":"Natural Science Foundation of Jiangsu Province","doi-asserted-by":"publisher","award":["BK20211235"],"award-info":[{"award-number":["BK20211235"]}],"id":[{"id":"10.13039\/501100004608","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["2242024k30060"],"award-info":[{"award-number":["2242024k30060"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Postgraduate Research and Practice Innovation Program of Jiangsu Province","award":["KYCX25_0459"],"award-info":[{"award-number":["KYCX25_0459"]}]},{"DOI":"10.13039\/501100017703","name":"Southeast University (SEU) Innovation Capability Enhancement Plan for Doctoral Students","doi-asserted-by":"publisher","award":["CXJH_SEU 25165"],"award-info":[{"award-number":["CXJH_SEU 25165"]}],"id":[{"id":"10.13039\/501100017703","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3580790","type":"journal-article","created":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T13:37:33Z","timestamp":1750253853000},"page":"1-11","source":"Crossref","is-referenced-by-count":4,"title":["Intelligent Fault Diagnosis for Battery Packs Using FCE-GCN: Addressing the Challenges of Class Imbalance and Feature Similarity"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-4483-5831","authenticated-orcid":false,"given":"Sizhe","family":"Liu","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Engineering Research Center of Electrical Transport Technology, Ministry of Education, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7906-4255","authenticated-orcid":false,"given":"Dezhi","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Engineering Research Center of Electrical Transport Technology, Ministry of Education, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6959-0569","authenticated-orcid":false,"given":"Chao","family":"Shen","sequence":"additional","affiliation":[{"name":"School of Cyber Science and Engineering, Xi’an Jiaotong University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9278-9218","authenticated-orcid":false,"given":"Yujian","family":"Ye","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Engineering Research Center of Electrical Transport Technology, Ministry of Education, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2696-5436","authenticated-orcid":false,"given":"Bin","family":"Jiang","sequence":"additional","affiliation":[{"name":"College of Automation Engineering, Nanjing University of Aeronautics and Astronautics, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3008194"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2024.3357909"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2023.3324322"},{"issue":"5","key":"ref4","first-page":"1455","article-title":"Sliding mode observer-based sensor fault diagnosis for lithium-ion battery packs","volume":"19","author":"Xu","year":"2023","journal-title":"Int. J. Innov. Comput. Inf. Control"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2023.3285453"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2021.3126776"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2024.114685"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3173038"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3165295"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.engfailanal.2024.108980"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.etran.2024.100374"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2024.235610"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2024.112812"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2024.121399"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2024.102397"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2994868"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2024.109402"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2019.08.099"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2023.102322"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3246470"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2893622"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.109353"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2024.235696"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2024.112324"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2024.108872"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3187737"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.etran.2023.100254"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3211568"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.23919\/PCMP.2023.000213"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICIT58233.2024.10541012"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2023.105872"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2023.107052"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111045"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11040008.pdf?arnumber=11040008","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,3]],"date-time":"2025-07-03T13:28:06Z","timestamp":1751549286000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11040008\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3580790","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}