{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T04:11:40Z","timestamp":1751343100269,"version":"3.41.0"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Plan","award":["2021YFB3203100"],"award-info":[{"award-number":["2021YFB3203100"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52075339"],"award-info":[{"award-number":["52075339"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"SJTU-SAST Joint Fund","doi-asserted-by":"publisher","award":["USCAST2023-26"],"award-info":[{"award-number":["USCAST2023-26"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3580897","type":"journal-article","created":{"date-parts":[[2025,6,18]],"date-time":"2025-06-18T17:37:33Z","timestamp":1750268253000},"page":"1-9","source":"Crossref","is-referenced-by-count":0,"title":["Temperature-Enhanced Type Compensation Method for Large-Range Eddy Current Displacement Sensors"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5088-0152","authenticated-orcid":false,"given":"Jie","family":"Yuan","sequence":"first","affiliation":[{"name":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3969-5148","authenticated-orcid":false,"given":"Kundong","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0523-8005","authenticated-orcid":false,"given":"Huaming","family":"Lei","sequence":"additional","affiliation":[{"name":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-9615-6684","authenticated-orcid":false,"given":"Run","family":"Zheng","sequence":"additional","affiliation":[{"name":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8431-8304","authenticated-orcid":false,"given":"Xin","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Electronic Information and Electrical Engineering, Shanghai Jiao Tong University, Shanghai, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.112120"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/lsens.2023.3297795"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2023.3342278"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2020.3024462"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/s41528-023-00261-4"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ojies.2022.3163014"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3204083"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2012945"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2832168"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2890032"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2023.3240175"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2019.2933347"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2511165"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/s18061952"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2498908"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2023.3331693"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1155\/2022\/6021182"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2020.3044777"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2022.102635"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2021.3089333"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2023.3312422"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2949511"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2013.09.016"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2014.03.008"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-022-29424-z"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1002\/lpor.202100166"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.3c03484"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2023.3239881"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2024.115595"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/19.245652"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11040079.pdf?arnumber=11040079","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,30]],"date-time":"2025-06-30T17:37:55Z","timestamp":1751305075000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11040079\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3580897","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}