{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T04:59:33Z","timestamp":1777611573116,"version":"3.51.4"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62303076"],"award-info":[{"award-number":["62303076"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62403213"],"award-info":[{"award-number":["62403213"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Open Foundation of the Guangdong Provincial Key Laboratory of Electronic Information Products Reliability Technology and Chaohu University Key Scientific Research Projects","award":["XLZ-202206"],"award-info":[{"award-number":["XLZ-202206"]}]},{"name":"Natural Science Research Program of Colleges and Universities of Anhui Province","award":["2023AH052109"],"award-info":[{"award-number":["2023AH052109"]}]},{"name":"Natural Science Research Program of Colleges and Universities of Anhui Province","award":["2023AH052105"],"award-info":[{"award-number":["2023AH052105"]}]},{"DOI":"10.13039\/501100015286","name":"Chaohu University Scientific Research Project","doi-asserted-by":"publisher","award":["KYQD-2023047"],"award-info":[{"award-number":["KYQD-2023047"]}],"id":[{"id":"10.13039\/501100015286","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100015286","name":"Chaohu University Scientific Research Project","doi-asserted-by":"publisher","award":["KYQD-2023046"],"award-info":[{"award-number":["KYQD-2023046"]}],"id":[{"id":"10.13039\/501100015286","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3582310","type":"journal-article","created":{"date-parts":[[2025,6,23]],"date-time":"2025-06-23T17:26:41Z","timestamp":1750699601000},"page":"1-12","source":"Crossref","is-referenced-by-count":7,"title":["Hierarchical Fault Diagnosis Method for Piezoresistive Pressure Sensor Based on GAF and CNN-SVM"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9690-8643","authenticated-orcid":false,"given":"Yi","family":"Ruan","sequence":"first","affiliation":[{"name":"School of Electronic Engineering, Chaohu University, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5425-8806","authenticated-orcid":false,"given":"Xinlong","family":"Yu","sequence":"additional","affiliation":[{"name":"Jianghuai Advance Technology Center, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6642-0740","authenticated-orcid":false,"given":"Yigang","family":"He","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Wuhan University, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3586-2244","authenticated-orcid":false,"given":"Yuanjie","family":"Fang","sequence":"additional","affiliation":[{"name":"School of Electronic Engineering, Chaohu University, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-7632-0542","authenticated-orcid":false,"given":"Jing","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electronic Engineering, Chaohu University, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7908-3854","authenticated-orcid":false,"given":"Hao","family":"Cong","sequence":"additional","affiliation":[{"name":"School of Electronic Engineering, Chaohu University, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.05.014"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3089236"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2012.03.027"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.5120\/11943-7745"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2024.3443423"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2024.3356121"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2980326"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3164435"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2024.3457991"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2021.3063166"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ac81a0"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2419013"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LSENS.2023.3330046"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2055775"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/S0005-1098(99)00177-6"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3215823"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417501"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2018.2791507"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3034975"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijhydene.2023.01.334"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3136264"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1515\/ijeeps-2022-0103"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/s00034-023-02392-5"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ad6178"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ac87c4"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/acf8e7"},{"key":"ref27","volume-title":"NXP China","year":"2005"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3097614"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/5.726791"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/72.991427"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1155\/2021\/5585990"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3267342"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11048665.pdf?arnumber=11048665","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,4]],"date-time":"2025-07-04T05:05:59Z","timestamp":1751605559000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11048665\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3582310","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}