{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,12]],"date-time":"2025-07-12T00:02:34Z","timestamp":1752278554406,"version":"3.41.2"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U20A20215","52375557","62375190"],"award-info":[{"award-number":["U20A20215","52375557","62375190"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004912","name":"Sichuan University","doi-asserted-by":"publisher","award":["2020SCUNG205"],"award-info":[{"award-number":["2020SCUNG205"]}],"id":[{"id":"10.13039\/501100004912","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100019065","name":"Tianjin Municipal Science and Technology Program","doi-asserted-by":"publisher","award":["24JCYBJC00160"],"award-info":[{"award-number":["24JCYBJC00160"]}],"id":[{"id":"10.13039\/501100019065","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3583365","type":"journal-article","created":{"date-parts":[[2025,6,26]],"date-time":"2025-06-26T13:42:34Z","timestamp":1750945354000},"page":"1-9","source":"Crossref","is-referenced-by-count":0,"title":["Noncontact Quantitative Temperature Field Reconstruction of Axisymmetric Flames With Phase Measurement Deflectometry"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-0324-1633","authenticated-orcid":false,"given":"Zekun","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Electronics and Information Engineering, Sichuan University, Chengdu, Sichuan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-4949-5988","authenticated-orcid":false,"given":"Yuting","family":"Liu","sequence":"additional","affiliation":[{"name":"Aeronautical Engineering College, Civil Aviation University of China, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4661-1574","authenticated-orcid":false,"given":"Ruiyang","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Sichuan University, Chengdu, Sichuan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-6835-8727","authenticated-orcid":false,"given":"Wei","family":"Hu","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Sichuan University, Chengdu, Sichuan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-6229-8710","authenticated-orcid":false,"given":"Renhao","family":"Ge","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Sichuan University, Chengdu, Sichuan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-5669-9523","authenticated-orcid":false,"given":"Manwei","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Sichuan University, Chengdu, Sichuan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1911-9354","authenticated-orcid":false,"given":"Jun","family":"Wu","sequence":"additional","affiliation":[{"name":"Aeronautical Engineering College, Civil Aviation University of China, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2382-9917","authenticated-orcid":false,"given":"Dahai","family":"Li","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering and the School of Aeronautics and Astronautics, Sichuan University, Chengdu, Sichuan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1016\/j.cja.2020.06.021"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/JSEN.2022.3152820"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1016\/j.engstruct.2021.112231"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1016\/j.paerosci.2021.100767"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1016\/j.enconman.2022.115687"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1016\/j.fuel.2022.126391"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1063\/1.1305516"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1016\/j.cbpa.2016.02.022"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.3390\/s140712305"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1088\/1361-6501\/acadf9"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1016\/j.optlastec.2023.109808"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1016\/j.optlaseng.2023.107835"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1109\/TIM.2024.3353864"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1364\/OE.540033"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1007\/s00348-020-03007-4"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1088\/0957-0233\/12\/9\/325"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1016\/j.measurement.2020.108860"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1007\/s00348-015-1927-5"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1117\/12.545704"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1364\/OL.522243"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1016\/j.optlaseng.2023.107831"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1364\/OE.518670"},{"doi-asserted-by":"publisher","key":"ref23","DOI":"10.1364\/OL.485063"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1117\/1.oe.59.2.024103"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1063\/5.0250966"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1016\/j.expthermflusci.2016.10.033"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1016\/j.ijleo.2019.02.077"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.2514\/1.T5360"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1016\/j.measurement.2020.108635"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.1016\/j.optlaseng.2018.04.019"},{"doi-asserted-by":"publisher","key":"ref31","DOI":"10.1007\/s00348-017-2367-1"},{"doi-asserted-by":"publisher","key":"ref32","DOI":"10.1007\/s11431-020-1663-5"},{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.1364\/OL.38.001446"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11052764.pdf?arnumber=11052764","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,11]],"date-time":"2025-07-11T17:43:58Z","timestamp":1752255838000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11052764\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3583365","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}