{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,14]],"date-time":"2026-06-14T22:25:33Z","timestamp":1781475933225,"version":"3.54.1"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2023YFF0615200"],"award-info":[{"award-number":["2023YFF0615200"]}]},{"name":"State Key Program of National Natural Science Foundation of China","award":["U23B20113"],"award-info":[{"award-number":["U23B20113"]}]},{"DOI":"10.13039\/501100001809","name":"Young Elite Scientists Sponsorship Program by China Association for Science and Technology","doi-asserted-by":"publisher","award":["2022QNRC001"],"award-info":[{"award-number":["2022QNRC001"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3584154","type":"journal-article","created":{"date-parts":[[2025,6,30]],"date-time":"2025-06-30T13:37:58Z","timestamp":1751290678000},"page":"1-11","source":"Crossref","is-referenced-by-count":3,"title":["A Novel Magnetic Field Gradient-Enhanced Excitation Source for Motion-Induced Eddy Current Testing"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9133-9709","authenticated-orcid":false,"given":"Bingkun","family":"Wei","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Tsinghua University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7315-2692","authenticated-orcid":false,"given":"Lisha","family":"Peng","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Tsinghua University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-7239-3448","authenticated-orcid":false,"given":"Shuzhi","family":"Wen","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Tsinghua University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7337-7525","authenticated-orcid":false,"given":"Jinghua","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Tsinghua University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2509-5523","authenticated-orcid":false,"given":"Shisong","family":"Li","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Tsinghua University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4442-2566","authenticated-orcid":false,"given":"Songling","family":"Huang","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Tsinghua University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2023.110409"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/2053-1591\/ad8ca2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.113285"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2893009"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3347805"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s10921-022-00891-0"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2015.02.004"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3279457"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2025.117547"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2507738"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2015.02.003"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.7498\/aps.72.20230064"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2021.3060390"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2023.102882"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3049551"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.egyr.2024.04.016"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ad9bd7"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2024.3524094"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s42835-023-01650-5"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/4235.996017"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2023.02.010"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-024-60402-1"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-024-53064-6"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2020.09.032"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2022.118831"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11059331.pdf?arnumber=11059331","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,18]],"date-time":"2025-07-18T04:54:37Z","timestamp":1752814477000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11059331\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3584154","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}