{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,14]],"date-time":"2026-01-14T18:38:49Z","timestamp":1768415929405,"version":"3.49.0"},"reference-count":57,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["82472104"],"award-info":[{"award-number":["82472104"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U24B2053"],"award-info":[{"award-number":["U24B2053"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Natural Science Basic Research Program of Shaanxi","award":["2025JC-JCQN-023"],"award-info":[{"award-number":["2025JC-JCQN-023"]}]},{"name":"Key Core Technology Research and Development of Shaanxi","award":["2024QY2-GJHX-03"],"award-info":[{"award-number":["2024QY2-GJHX-03"]}]},{"DOI":"10.13039\/501100019448","name":"Innovation Capability Support Program of Shaanxi","doi-asserted-by":"publisher","award":["2023-CX-TD-54"],"award-info":[{"award-number":["2023-CX-TD-54"]}],"id":[{"id":"10.13039\/501100019448","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3585221","type":"journal-article","created":{"date-parts":[[2025,7,2]],"date-time":"2025-07-02T13:44:04Z","timestamp":1751463844000},"page":"1-16","source":"Crossref","is-referenced-by-count":2,"title":["A Multimodal Information Fusion Network Combining CNN and Adaptive Mamba for Fault Monitoring of Selective Laser Melting Ceramic Printing Instrument"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-3564-508X","authenticated-orcid":false,"given":"Han","family":"Xu","sequence":"first","affiliation":[{"name":"State Key Laboratory of Electromechanical Integrated Manufacturing of High-performance Electronic Equipment, School of Electro-Mechanical Engineering, Xidian University, Xi’an, Shaanxi, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6360-6478","authenticated-orcid":false,"given":"Ruichan","family":"Lv","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electromechanical Integrated Manufacturing of High-performance Electronic Equipment, School of Electro-Mechanical Engineering, Xidian University, Xi’an, Shaanxi, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2534-1138","authenticated-orcid":false,"given":"Bin","family":"Zi","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electromechanical Integrated Manufacturing of High-performance Electronic Equipment, School of Electro-Mechanical Engineering, Xidian University, Xi’an, Shaanxi, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jeurceramsoc.2023.07.033"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.matdes.2024.112632"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ceramint.2023.02.081"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.addma.2022.103318"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.jallcom.2023.172821"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.oceram.2023.100399"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.2351\/7.0001213"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2021.01.008"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3480214"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2775345"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3272033"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2023.110919"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2023.06.016"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2021.07.002"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1080\/10589759.2024.2421938"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1784\/insi.2024.66.8.488"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3390\/machines12080497"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/electronics13132447"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1080\/15325008.2023.2276828"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/0963-8695(92)90636-U"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-021-07721-z"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3502723"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2910524"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.addma.2024.103974"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.compstruct.2022.115629"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2024.111497"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3338664"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2023.109505"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2024.111770"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1115\/1.4063954"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.addma.2021.102364"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2024.111883"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2024.08.002"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.52783\/jes.3428"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3363789"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2024.111457"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-023-02107-2"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmrt.2022.07.086"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-024-02503-2"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3544721"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3256400"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2024.112230"},{"key":"ref43","article-title":"Efficiently modeling long sequences with structured state spaces","author":"Gu","year":"2021","journal-title":"arXiv:2111.00396"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/j.bspc.2024.106998"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TASSP.1981.1163711"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/tgrs.2024.3430985"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1016\/j.addma.2025.104692"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1016\/j.egyr.2022.09.055"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.243"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00474"},{"key":"ref52","first-page":"6105","article-title":"Efficientnet: Rethinking model scaling for convolutional neural networks","volume-title":"Proc. Int. Conf. Mach. Learn.","author":"Tan"},{"key":"ref53","article-title":"An image is worth 16\u00d716 words: Transformers for image recognition at scale","author":"Dosovitskiy","year":"2020","journal-title":"arXiv:2010.11929"},{"key":"ref54","article-title":"Vision mamba: Efficient visual representation learning with bidirectional state space model","author":"Zhu","year":"2024","journal-title":"arXiv:2401.09417"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/JBHI.2022.3171523"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/tgrs.2023.3286826"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1364\/BOE.516764"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11063420.pdf?arnumber=11063420","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,19]],"date-time":"2025-07-19T04:49:28Z","timestamp":1752900568000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11063420\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":57,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3585221","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}