{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,16]],"date-time":"2026-07-16T17:57:36Z","timestamp":1784224656458,"version":"3.55.0"},"reference-count":44,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100018525","name":"Key Research and Development Program of Sichuan Province","doi-asserted-by":"publisher","award":["2022YFSY0056"],"award-info":[{"award-number":["2022YFSY0056"]}],"id":[{"id":"10.13039\/501100018525","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004858","name":"Talent Introduction Fund Project of Sichuan University of Science and Engineering","doi-asserted-by":"publisher","award":["2018RCL19"],"award-info":[{"award-number":["2018RCL19"]}],"id":[{"id":"10.13039\/501100004858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3586376","type":"journal-article","created":{"date-parts":[[2025,7,9]],"date-time":"2025-07-09T23:17:37Z","timestamp":1752103057000},"page":"1-15","source":"Crossref","is-referenced-by-count":3,"title":["Evaluating and Optimizing Conventional Training Circuits for Analog Fault Diagnosis via Transfer Learning"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0003-7594-6263","authenticated-orcid":false,"given":"Yurong","family":"Chen","sequence":"first","affiliation":[{"name":"School of Automation and Information Engineering, Artificial Intelligence Key Laboratory of Sichuan Province, Sichuan University of Science and Engineering, Zigong, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-7727-3022","authenticated-orcid":false,"given":"Kun","family":"Peng","sequence":"additional","affiliation":[{"name":"School of Automation and Information Engineering, Artificial Intelligence Key Laboratory of Sichuan Province, Sichuan University of Science and Engineering, Zigong, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3900-6664","authenticated-orcid":false,"given":"Dan","family":"Huang","sequence":"additional","affiliation":[{"name":"School of Automation and Information Engineering, Artificial Intelligence Key Laboratory of Sichuan Province, Sichuan University of Science and Engineering, Zigong, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-9442-5517","authenticated-orcid":false,"given":"Qinglin","family":"Tang","sequence":"additional","affiliation":[{"name":"School of Automation and Information Engineering, Artificial Intelligence Key Laboratory of Sichuan Province, Sichuan University of Science and Engineering, Zigong, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2818114"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2823765"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3024337"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-018-1362-7"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2836058"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3196738"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1177\/1847979020946189"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2013.11.012"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2020.04.113"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2690940"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1063\/5.0142657"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-021-86916-6"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3194890"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/s00500-022-07226-1"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2016.07.018"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.02.044"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2023.105962"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.121003"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.120959"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3137992"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2022.105633"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.121964"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.compeleceng.2021.107162"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-021-01835-w"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2021.01.001"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2968744"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3076282"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.3390\/sym13061096"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2599142"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2013.06.006"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-016-0721-5"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2015.11.041"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2015.12.131"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2016.11.012"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aaa33a"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2015.09.050"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2923017"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/QoMEX.2016.7498955"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2016.2551940"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/MSPEC.1969.5214222"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TCT.1955.6500159"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2019.2913857"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2002.806004"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11075722.pdf?arnumber=11075722","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,19]],"date-time":"2025-07-19T04:49:52Z","timestamp":1752900592000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11075722\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":44,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3586376","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}