{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T19:18:46Z","timestamp":1754162326008,"version":"3.41.2"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003995","name":"Natural Science Foundation of Anhui Province","doi-asserted-by":"publisher","award":["228085ME142"],"award-info":[{"award-number":["228085ME142"]}],"id":[{"id":"10.13039\/501100003995","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Comprehensive Research Facility for Fusion Technology Program of China","award":["20180000527301001228"],"award-info":[{"award-number":["20180000527301001228"]}]},{"DOI":"10.13039\/501100013282","name":"Open Fund of Magnetic Confinement Fusion Laboratory of Anhui Province","doi-asserted-by":"publisher","award":["2024AMF04003"],"award-info":[{"award-number":["2024AMF04003"]}],"id":[{"id":"10.13039\/501100013282","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3587366","type":"journal-article","created":{"date-parts":[[2025,7,11]],"date-time":"2025-07-11T17:43:49Z","timestamp":1752255829000},"page":"1-11","source":"Crossref","is-referenced-by-count":0,"title":["Study on the Influence of Strong Background Magnetic Field on Hall Current Sensors and Mitigating Strategies"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0009-9574-7011","authenticated-orcid":false,"given":"Xingjian","family":"Zhao","sequence":"first","affiliation":[{"name":"Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Li","family":"Jiang","sequence":"additional","affiliation":[{"name":"Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9880-8080","authenticated-orcid":false,"given":"Ge","family":"Gao","sequence":"additional","affiliation":[{"name":"Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0289-8806","authenticated-orcid":false,"given":"Hong","family":"Lei","sequence":"additional","affiliation":[{"name":"Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/imtc.1996.507616"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/vppc.2007.4544180"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tmag.2015.2446332"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/s150716740"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2009.2022081"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2009.2013914"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2826462"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2012.03.014"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/icems.2013.6713232"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2020.106945"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/elt.2008.124"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tasc.2008.922540"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.fusengdes.2005.06.136"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3162625"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tmag.2009.2027899"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2017.2674630"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmmm.2020.167678"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tmag.2019.2950082"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2006.874277"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2018.2807420"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11078834.pdf?arnumber=11078834","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,30]],"date-time":"2025-07-30T05:08:49Z","timestamp":1753852129000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11078834\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3587366","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}