{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,12]],"date-time":"2026-06-12T15:58:37Z","timestamp":1781279917400,"version":"3.54.1"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52407070"],"award-info":[{"award-number":["52407070"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52177029"],"award-info":[{"award-number":["52177029"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3588924","type":"journal-article","created":{"date-parts":[[2025,7,14]],"date-time":"2025-07-14T17:42:23Z","timestamp":1752514943000},"page":"1-15","source":"Crossref","is-referenced-by-count":7,"title":["Open-Circuit Fault Diagnosis Method for the Dual Three-Phase Permanent Magnet Synchronous Motor Drive in the Fault-Tolerant Mode"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6531-863X","authenticated-orcid":false,"given":"Haoyue","family":"Tang","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, China University of Mining and Technology, Xuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-6480-2657","authenticated-orcid":false,"given":"Zhicong","family":"Dong","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, China University of Mining and Technology, Xuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1857-6150","authenticated-orcid":false,"given":"Wenlong","family":"Li","sequence":"additional","affiliation":[{"name":"Department of Automation, Nanjing University of Science and Technology, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9670-4285","authenticated-orcid":false,"given":"Guoqiang","family":"Han","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, China University of Mining and Technology, Xuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5505-9040","authenticated-orcid":false,"given":"He","family":"Cheng","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, China University of Mining and Technology, Xuzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1465-7014","authenticated-orcid":false,"given":"Weili","family":"Li","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Beijing Jiaotong University, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2493510"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3353876"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3088361"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3376012"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3305653"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3082325"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2554540"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/machines10030208"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2020.2996817"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3204414"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2962407"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2670924"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2022.3168780"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3541811"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2021.3132236"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3090814"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2876400"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2021.3120239"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2023.3312428"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2559498"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2448211"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2944056"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2023.3340871"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2632118"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2024.3490700"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3017637"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2022.3161437"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2703682"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3199938"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/28.464525"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11079991.pdf?arnumber=11079991","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,24]],"date-time":"2025-07-24T04:44:46Z","timestamp":1753332286000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11079991\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3588924","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}