{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,14]],"date-time":"2026-01-14T17:23:45Z","timestamp":1768411425574,"version":"3.49.0"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Education and Research Foundation for Young Teachers of Education Department of Fujian Province","award":["JAT241207"],"award-info":[{"award-number":["JAT241207"]}]},{"name":"Start-Up Fund From Xiamen Institute of Technology"},{"name":"International Collaborative Innovation Projects of Shenzhen Science and Technology Innovation Commission","award":["GJHZ20240218111359002"],"award-info":[{"award-number":["GJHZ20240218111359002"]}]},{"name":"Guangdong Province Department of Natural Resources","award":["GDNRC[2022]22"],"award-info":[{"award-number":["GDNRC[2022]22"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3588925","type":"journal-article","created":{"date-parts":[[2025,7,15]],"date-time":"2025-07-15T17:42:06Z","timestamp":1752601326000},"page":"1-8","source":"Crossref","is-referenced-by-count":2,"title":["High-Precision Temperature Sensing Based on Sagnac Interferometer and BPNN in Fiber Ring Laser"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1499-2608","authenticated-orcid":false,"given":"Weihao","family":"Lin","sequence":"first","affiliation":[{"name":"Higher Educational Key Laboratory for Flexible Manufacturing Equipment Integration of Fujian Province (Xiamen Institute of Technology), Xiamen, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-4945-1489","authenticated-orcid":false,"given":"Deyu","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Innovation and Entrepreneurship, Southern University of Science and Technology, Shenzhen, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-4280-3648","authenticated-orcid":false,"given":"Junjie","family":"Bai","sequence":"additional","affiliation":[{"name":"Higher Educational Key Laboratory for Flexible Manufacturing Equipment Integration of Fujian Province (Xiamen Institute of Technology), Xiamen, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-4045-4750","authenticated-orcid":false,"given":"Huaxin","family":"Gu","sequence":"additional","affiliation":[{"name":"School of Innovation and Entrepreneurship, Southern University of Science and Technology, Shenzhen, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-3094-207X","authenticated-orcid":false,"given":"Xingwei","family":"Chen","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Shenzhen, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0961-934X","authenticated-orcid":false,"given":"Jingming","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, The Hong Kong Polytechnic University, Hong Kong, SAR, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0605-3248","authenticated-orcid":false,"given":"Yuhui","family":"Liu","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Shenzhen, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8616-0659","authenticated-orcid":false,"given":"Fang","family":"Zhao","sequence":"additional","affiliation":[{"name":"Zhongshan Institute of Changchun University of Science and Technology, Zhongshan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1272-1959","authenticated-orcid":false,"given":"Li-Yang","family":"Shao","sequence":"additional","affiliation":[{"name":"Department of Electronic and Electrical Engineering, Southern University of Science and Technology, Shenzhen, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2015.04.022"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/adma.201503825"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2023.112015"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/s22155722"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-025-90749-y"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/jlt.2023.3325255"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1364\/ol.33.002455"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2023.3347288"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/lpt.2023.3306430"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2024.3484590"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2025.116251"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.yofte.2023.103568"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1364\/oe.419260"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2021.107147"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1364\/oe.17.002481"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2020.112385"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/jlt.2011.2174195"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1364\/ao.56.000156"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2019.2946399"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1364\/oe.435772"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2021.3113952"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1155\/2017\/8187451"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.3390\/app11157103"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1088\/1555-6611\/aa94dd"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/lpt.2015.2514105"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/jlt.2019.2954117"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2022.3205701"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2025.112523"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijleo.2018.07.064"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/s13320-023-0681-1"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/jphot.2012.2217945"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/jphot.2024.3351092"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1038\/323533a0"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-45528-0"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11080040.pdf?arnumber=11080040","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,26]],"date-time":"2025-07-26T07:08:05Z","timestamp":1753513685000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11080040\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3588925","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}