{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T02:20:07Z","timestamp":1769912407448,"version":"3.49.0"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["92167107"],"award-info":[{"award-number":["92167107"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52475530"],"award-info":[{"award-number":["52475530"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3588996","type":"journal-article","created":{"date-parts":[[2025,7,15]],"date-time":"2025-07-15T17:42:06Z","timestamp":1752601326000},"page":"1-11","source":"Crossref","is-referenced-by-count":1,"title":["Multiple Wave Shape Mode Decomposition for Bearing Fault Diagnosis"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2681-4198","authenticated-orcid":false,"given":"Chaoang","family":"Xiao","sequence":"first","affiliation":[{"name":"School of Mechanical Engineering, Tongji University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8875-3538","authenticated-orcid":false,"given":"Jiantao","family":"Chang","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Electromechanical Integrated Manufacturing of High-Performance Electronic Equipments, Xidian University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3204-2486","authenticated-orcid":false,"given":"Jianbo","family":"Yu","sequence":"additional","affiliation":[{"name":"School of Mechanical Engineering, Tongji University, Shanghai, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2023.110107"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3231324"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2793271"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1177\/14759217231181514"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.mechmachtheory.2012.04.008"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1177\/1475921720906112"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2022.3215545"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3330955"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3280512"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1177\/10775463221082924"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3192597"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2868296"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2024.111112"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2024.109733"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3428614"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2021.108145"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2024.3476495"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1155\/2024\/5541701"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ad0e3e"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2023.110108"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2023.109035"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2024.112265"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3223980"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2017.2731300"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.109755"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2023.02.020"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ad846a"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3372224"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2024.112116"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2021.3108678"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3222660"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2015.01.022"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2875956"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11080445.pdf?arnumber=11080445","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,30]],"date-time":"2025-07-30T18:50:33Z","timestamp":1753901433000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11080445\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":33,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3588996","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}