{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,24]],"date-time":"2025-09-24T10:33:54Z","timestamp":1758710034570,"version":"3.41.2"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004502","name":"College Student Innovation Training Program of Nanjing University of Posts and Telecommunications","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004502","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3589697","type":"journal-article","created":{"date-parts":[[2025,7,16]],"date-time":"2025-07-16T17:38:39Z","timestamp":1752687519000},"page":"1-9","source":"Crossref","is-referenced-by-count":1,"title":["Multiple Physical Quantity Sensing and Logical Operation Realized by Electromagnetically Induced Absorption"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0001-8999-5934","authenticated-orcid":false,"given":"Jia-Rui","family":"Wang","sequence":"first","affiliation":[{"name":"College of Electronic and Optical Engineering and the College of Flexible Electronics (Future Technology), Nanjing University of Posts and Telecommunications, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9890-8345","authenticated-orcid":false,"given":"Hai-Feng","family":"Zhang","sequence":"additional","affiliation":[{"name":"College of Electronic and Optical Engineering and the College of Flexible Electronics (Future Technology), Nanjing University of Posts and Telecommunications, Nanjing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/33.62520"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/JQE.2021.3091153"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/ACCESS.2014.2321661"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1109\/JPHOT.2017.2736946"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1117\/12.905637"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/JQE.2021.3115813"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1109\/ICRC.2018.8638607"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1364\/AO.473410"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1109\/TNANO.2021.3069401"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1103\/PhysRevA.59.4732"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1109\/TIM.2023.3239641"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1109\/JPHOT.2015.2513210"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1103\/PhysRevX.7.021048"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1016\/j.optcom.2017.12.037"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1364\/OE.24.026201"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1109\/TIM.2023.3325859"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1109\/ACCESS.2022.3170912"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/LSENS.2022.3178918"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1109\/JSEN.2019.2903731"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1109\/CSNDSP.2012.6292729"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1109\/JSEN.2018.2854375"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.3139\/146.030226"},{"year":"2005","author":"Seward","article-title":"High temperature glass melt property database for process modeling","key":"ref23"},{"doi-asserted-by":"publisher","key":"ref24","DOI":"10.1109\/T-ED.1981.20277"},{"doi-asserted-by":"publisher","key":"ref25","DOI":"10.1109\/TMTT.2017.2691775"},{"doi-asserted-by":"publisher","key":"ref26","DOI":"10.1364\/OE.23.001015"},{"doi-asserted-by":"publisher","key":"ref27","DOI":"10.1063\/1.3360296"},{"doi-asserted-by":"publisher","key":"ref28","DOI":"10.1007\/s00723-021-01330-5"},{"doi-asserted-by":"publisher","key":"ref29","DOI":"10.1016\/j.physleta.2015.05.011"},{"doi-asserted-by":"publisher","key":"ref30","DOI":"10.1038\/s41598-020-66427-6"},{"doi-asserted-by":"publisher","key":"ref31","DOI":"10.1109\/LPT.2016.2596580"},{"doi-asserted-by":"publisher","key":"ref32","DOI":"10.1109\/LPT.2014.2340435"},{"doi-asserted-by":"publisher","key":"ref33","DOI":"10.1109\/LAWP.2022.3162308"},{"doi-asserted-by":"publisher","key":"ref34","DOI":"10.1109\/JSEN.2022.3168827"},{"doi-asserted-by":"publisher","key":"ref35","DOI":"10.1109\/JSEN.2019.2918214"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11082380.pdf?arnumber=11082380","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T04:59:11Z","timestamp":1754024351000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11082380\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":35,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3589697","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}