{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,3]],"date-time":"2026-03-03T16:25:25Z","timestamp":1772555125055,"version":"3.50.1"},"reference-count":53,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62463001"],"award-info":[{"award-number":["62463001"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004607","name":"Natural Science Foundation of Guangxi Province","doi-asserted-by":"publisher","award":["AA22068071"],"award-info":[{"award-number":["AA22068071"]}],"id":[{"id":"10.13039\/501100004607","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3591852","type":"journal-article","created":{"date-parts":[[2025,7,23]],"date-time":"2025-07-23T18:42:41Z","timestamp":1753296161000},"page":"1-19","source":"Crossref","is-referenced-by-count":1,"title":["Quantum Parallel Transformer Model for Detecting Multiclass Insulator Faults"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0003-6138-3834","authenticated-orcid":false,"given":"Yijin","family":"Lin","sequence":"first","affiliation":[{"name":"College of Electrical Engineering, Guangxi University, Nanning, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-8400-8094","authenticated-orcid":false,"given":"Linfei","family":"Yin","sequence":"additional","affiliation":[{"name":"College of Electrical Engineering, Guangxi University, Nanning, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3272046"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3522390"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2024.123983"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2024.131222"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3420265"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2022.117583"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2024.3353203"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.112614"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3390695"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3305667"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2024.132559"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111238"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.122739"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.122212"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.120096"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3201499"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3418082"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3453332"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/tpwrd.2020.3038880"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108886"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2023.3319387"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/tits.2023.3282204"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/tmm.2023.3293333"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2024.110437"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2024.112313"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.121638"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3311065"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.compag.2024.109160"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2022.119702"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2023.122282"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2022.06.010"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2024.109976"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.109066"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2023.109590"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2024.123354"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/s11432-023-3879-7"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2023.09.040"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2023.109092"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2022.118665"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2024.116518"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.120845"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2023.102007"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/tmm.2023.3240881"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2021.3119563"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2022.104914"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2022.108998"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2023.06.020"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3194909"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2023.109347"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.112776"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3488136"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3219468"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2023.126384"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11091550.pdf?arnumber=11091550","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,2]],"date-time":"2026-03-02T20:55:25Z","timestamp":1772484925000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11091550\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":53,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3591852","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}