{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,21]],"date-time":"2026-04-21T15:05:17Z","timestamp":1776783917166,"version":"3.51.2"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62473155"],"award-info":[{"award-number":["62473155"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62473154"],"award-info":[{"award-number":["62473154"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62473156"],"award-info":[{"award-number":["62473156"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Shanghai Oriental Talents Program Youth Project","award":["QNKJ2024034"],"award-info":[{"award-number":["QNKJ2024034"]}]},{"name":"Shanghai Chenguang Project","award":["21CGA37"],"award-info":[{"award-number":["21CGA37"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3593560","type":"journal-article","created":{"date-parts":[[2025,7,29]],"date-time":"2025-07-29T18:29:54Z","timestamp":1753813794000},"page":"1-10","source":"Crossref","is-referenced-by-count":3,"title":["Multitier Dynamic Dual Kullback\u2013Leibler Divergence Based on Manifold and Sensitive Features for Incipient Fault Detection"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1379-245X","authenticated-orcid":false,"given":"Bing","family":"Song","sequence":"first","affiliation":[{"name":"Key Laboratory of Smart Manufacturing in Energy Chemical Process, Ministry of Education, East China University of Science and Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-2543-0348","authenticated-orcid":false,"given":"Yimeng","family":"Song","sequence":"additional","affiliation":[{"name":"Key Laboratory of Smart Manufacturing in Energy Chemical Process, Ministry of Education, East China University of Science and Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9400-1415","authenticated-orcid":false,"given":"Hongbo","family":"Shi","sequence":"additional","affiliation":[{"name":"Key Laboratory of Smart Manufacturing in Energy Chemical Process, Ministry of Education, East China University of Science and Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5058-8899","authenticated-orcid":false,"given":"Yang","family":"Tao","sequence":"additional","affiliation":[{"name":"Key Laboratory of Smart Manufacturing in Energy Chemical Process, Ministry of Education, East China University of Science and Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9626-7831","authenticated-orcid":false,"given":"Shuai","family":"Tan","sequence":"additional","affiliation":[{"name":"Key Laboratory of Smart Manufacturing in Energy Chemical Process, Ministry of Education, East China University of Science and Technology, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3033943"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3240732"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3168930"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2733501"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2970664"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2942560"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2019.08.022"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3187700"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3548370"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3305653"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2022.108657"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2019.105564"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2024.3405026"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2023.108348"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2018.07.103"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2024.120386"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2024.3402653"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.9b06826"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2021.108308"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2024.111706"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.psep.2022.11.076"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2022.04.006"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3199239"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2014.03.013"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2013.11.013"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2018.05.007"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3241680"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2010.03.003"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2024.3360030"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2810822"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3015034"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2021.104784"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11098967.pdf?arnumber=11098967","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,15]],"date-time":"2025-08-15T04:46:17Z","timestamp":1755233177000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11098967\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3593560","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}