{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,10]],"date-time":"2025-12-10T16:03:48Z","timestamp":1765382628266,"version":"3.43.0"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Brazilian Funding Agency: the National Council for Scientific and Technological Development","award":["306774\/2021-6"],"award-info":[{"award-number":["306774\/2021-6"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3593579","type":"journal-article","created":{"date-parts":[[2025,7,29]],"date-time":"2025-07-29T18:29:54Z","timestamp":1753813794000},"page":"1-8","source":"Crossref","is-referenced-by-count":1,"title":["Monitoring of 3-D Printing Defects Using the Electromechanical Impedance (EMI) Technique"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2672-6497","authenticated-orcid":false,"given":"Cristiano Soares","family":"Junior","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, São Paulo State University (UNESP), Bauru Campus, São Paulo, Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0130-0975","authenticated-orcid":false,"given":"F\u00e1bio Isaac","family":"Ferreira","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, São Paulo State University (UNESP), Bauru Campus, São Paulo, Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9934-4465","authenticated-orcid":false,"given":"Paulo Roberto","family":"de Aguiar","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, São Paulo State University (UNESP), Bauru Campus, São Paulo, Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-8428-5927","authenticated-orcid":false,"given":"Vict\u00f3ria Dutra","family":"Kennerly","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, São Paulo State University (UNESP), Bauru Campus, São Paulo, Brazil"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/ecsa-6-06571"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3295460"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/cgpm2020-07159"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/siela61056.2024.10637823"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/machines12030166"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s11740-023-01234-2"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1149\/2754-2726\/ad7a88"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/ecsa-9-13285"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2024.08.282"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-023-12375-0"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.istruc.2023.03.017"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s40430-024-04916-9"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2022.3172230"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2017.12.220"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1088\/1361-665x\/acfa7e"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2009.2018693"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1177\/1045389x17689942"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-019-04733-8"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-018-2390-2"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2018.2792854"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1177\/1475921717715240"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.matpr.2021.09.413"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2018.5226"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.promfg.2020.05.104"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1177\/1045389x14538532"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11099004.pdf?arnumber=11099004","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,7]],"date-time":"2025-08-07T04:57:31Z","timestamp":1754542651000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11099004\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3593579","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}