{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,15]],"date-time":"2025-08-15T00:51:14Z","timestamp":1755219074300,"version":"3.43.0"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"NSF, China","award":["62327807","62173058"],"award-info":[{"award-number":["62327807","62173058"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3593607","type":"journal-article","created":{"date-parts":[[2025,7,31]],"date-time":"2025-07-31T18:32:17Z","timestamp":1753986737000},"page":"1-19","source":"Crossref","is-referenced-by-count":0,"title":["In Situ Measurement of Rod-Like Crystal Size and Surface Area During Crystallization via Virtual Stereo Imaging"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1327-1603","authenticated-orcid":false,"given":"Yongcan","family":"Shuang","sequence":"first","affiliation":[{"name":"Institute of Advanced Detection and Control Technology, Dalian University of Technology, Dalian, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1243-4546","authenticated-orcid":false,"given":"Tao","family":"Liu","sequence":"additional","affiliation":[{"name":"Institute of Advanced Detection and Control Technology, Dalian University of Technology, Dalian, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0509-7780","authenticated-orcid":false,"given":"Ji","family":"Fan","sequence":"additional","affiliation":[{"name":"Institute of Advanced Detection and Control Technology, Dalian University of Technology, Dalian, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0402-7553","authenticated-orcid":false,"given":"Bo","family":"Song","sequence":"additional","affiliation":[{"name":"Institute of Advanced Detection and Control Technology, Dalian University of Technology, Dalian, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0930-6623","authenticated-orcid":false,"given":"Yonghong","family":"Tan","sequence":"additional","affiliation":[{"name":"College of Information, Mechanical and Electrical Engineering, Shanghai Normal University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3586-1164","authenticated-orcid":false,"given":"Qi","family":"Zhang","sequence":"additional","affiliation":[{"name":"Institute of Chemical Materials, China Academy of Engineering Physics, Mianyang, Sichuan, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1035-8861","authenticated-orcid":false,"given":"Hongbin","family":"Zhang","sequence":"additional","affiliation":[{"name":"Institute of Materials Science, Technical University of Darmstadt, Darmstadt, Germany"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1146\/annurev-chembioeng-062011-081043"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2015.05.053"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3330217"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1021\/acs.cgd.3c00273"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1205\/cherd06203"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2008.08.007"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1021\/cg401098x"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2013.11.003"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.7b02439"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3277130"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2016.04.025"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2007.07.018"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2016.03.039"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1021\/acs.cgd.8b00883"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.cej.2022.138940"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.powtec.2024.119582"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.9b05828"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2018.06.067"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3470016"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/3329784"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2021.3059968"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2021.3054390"},{"volume-title":"Ultralytics YOLO V8","year":"2023","author":"Jocher","key":"ref23"},{"key":"ref24","first-page":"1027","article-title":"K-means++: The advantages of careful seeding","volume-title":"Proc. 18th Annu. ACM-SIAM Symp. Discrete Algorithms","author":"David","year":"2007"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.1979.4310076"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1006\/jvci.1999.0442"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/B978-0-12-460510-7.50024-0"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s11045-014-0293-4"},{"volume-title":"Advanced Auto Labeling Solution with Added Features","year":"2023","author":"Wang","key":"ref29"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1002\/aic.15041"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11105014.pdf?arnumber=11105014","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,6]],"date-time":"2025-08-06T17:59:39Z","timestamp":1754503179000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11105014\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3593607","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}