{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,23]],"date-time":"2026-01-23T23:59:57Z","timestamp":1769212797574,"version":"3.49.0"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100005089","name":"Beijing Natural Science Foundation","doi-asserted-by":"publisher","award":["L191008"],"award-info":[{"award-number":["L191008"]}],"id":[{"id":"10.13039\/501100005089","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Systemic Major Project of China State Railway Group Co., Ltd.,","award":["P2018J001"],"award-info":[{"award-number":["P2018J001"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3595232","type":"journal-article","created":{"date-parts":[[2025,8,4]],"date-time":"2025-08-04T18:44:43Z","timestamp":1754333083000},"page":"1-17","source":"Crossref","is-referenced-by-count":1,"title":["An Improved Wiener-Based Remaining Useful Life Prediction Approach With Reduced Uncertainty for High-Power IGBT Modules"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0006-4347-702X","authenticated-orcid":false,"given":"Hengzhi","family":"Liu","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Beijing Jiaotong University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3927-6763","authenticated-orcid":false,"given":"He-Sheng","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Beijing Jiaotong University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-6046-8034","authenticated-orcid":false,"given":"Yicong","family":"Tang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Beijing Jiaotong University, Beijing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2023.3274567"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3472910"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2025.3530163"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3415439"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3518062"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2124436"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3470018"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3446831"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2024.3436873"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3527602"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3398070"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.tws.2024.112330"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2024.111167"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3529072"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3541804"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.112739"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3569885"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2025.135719"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3527527"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2023.3266403"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3346507"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3541667"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2182221"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3436131"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2025.110975"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2025.3556137"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2023.3319497"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2022.3159273"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3541658"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2022.108854"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3332936"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/s40747-024-01773-w"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3554875"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3551471"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3329158"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3548219"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2010.07.135"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/tpel.2024.3463694"},{"key":"ref39","volume-title":"Qualification of Power Modules for Use in Power Electronics Converter Units in Motor Vehicles","year":"2021"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11108964.pdf?arnumber=11108964","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,15]],"date-time":"2025-08-15T05:09:55Z","timestamp":1755234595000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11108964\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":39,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3595232","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}