{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,11]],"date-time":"2025-09-11T20:22:57Z","timestamp":1757622177662,"version":"3.44.0"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100005089","name":"Research Project of Beijing Municipal Natural Science Foundation","doi-asserted-by":"publisher","award":["BJXZ2021-012-00046"],"award-info":[{"award-number":["BJXZ2021-012-00046"]}],"id":[{"id":"10.13039\/501100005089","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52375524"],"award-info":[{"award-number":["52375524"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Research Project of Beijing Municipal Natural Science Foundation and Beijing Education Committee","award":["KZ201911232044"],"award-info":[{"award-number":["KZ201911232044"]}]},{"name":"Ministry of Education Supply and Demand Docking Employment Education Project","award":["2023122884988"],"award-info":[{"award-number":["2023122884988"]}]},{"DOI":"10.13039\/501100018528","name":"Xuzhou Science and Technology Project","doi-asserted-by":"publisher","award":["90250886701313"],"award-info":[{"award-number":["90250886701313"]}],"id":[{"id":"10.13039\/501100018528","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3600819","type":"journal-article","created":{"date-parts":[[2025,8,25]],"date-time":"2025-08-25T20:44:34Z","timestamp":1756154674000},"page":"1-13","source":"Crossref","is-referenced-by-count":0,"title":["Development of a Compact Triaxial FBG Vibration Sensor for Medium-High Frequency Applications via Multiobjective Optimization Design"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2070-7428","authenticated-orcid":false,"given":"Kun","family":"Li","sequence":"first","affiliation":[{"name":"School of Instrument Science and Optoelectronic Engineering, Beijing Information Science and Technology University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9178-5688","authenticated-orcid":false,"given":"Mingli","family":"Dong","sequence":"additional","affiliation":[{"name":"School of Instrument Science and Optoelectronic Engineering, Beijing Information Science and Technology University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-9023-7696","authenticated-orcid":false,"given":"Jingtao","family":"Xin","sequence":"additional","affiliation":[{"name":"School of Instrument Science and Optoelectronic Engineering, Beijing Information Science and Technology University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-9430-9149","authenticated-orcid":false,"given":"Wu","family":"Zhao","sequence":"additional","affiliation":[{"name":"Jiangsu Vocational Institute of Architectural Technology, Xuzhou, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-8611-5705","authenticated-orcid":false,"given":"Chenbo","family":"Yu","sequence":"additional","affiliation":[{"name":"School of Instrument Science and Optoelectronic Engineering, Beijing Information Science and Technology University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0451-8531","authenticated-orcid":false,"given":"Lianqing","family":"Zhu","sequence":"additional","affiliation":[{"name":"School of Instrument Science and Optoelectronic Engineering, Beijing Information Science and Technology University, Beijing, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2020.3000257"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2024.3400169"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2021.3066163"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.eng.2021.02.022"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2021.3073394"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3472871"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3522679"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3280539"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2024.3365546"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2023.109131"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1108\/sr-10-2020-0243"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3406839"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2021.3118360"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2024.3503774"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.yofte.2023.103360"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2019.2936596"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3390\/s17010206"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2015.10.018"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3223061"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/jlt.2021.3091518"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.113865"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/jlt.2021.3058240"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.3390\/s21144715"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11141549.pdf?arnumber=11141549","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,8]],"date-time":"2025-09-08T17:44:44Z","timestamp":1757353484000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11141549\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3600819","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}