{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,12]],"date-time":"2026-08-12T22:18:46Z","timestamp":1786573126210,"version":"build-2736575974"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100013254","name":"National College Students\u2019 Innovation and Entrepreneurship Training Program Project","doi-asserted-by":"publisher","award":["202410488022X"],"award-info":[{"award-number":["202410488022X"]}],"id":[{"id":"10.13039\/501100013254","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3602542","type":"journal-article","created":{"date-parts":[[2025,8,25]],"date-time":"2025-08-25T20:44:34Z","timestamp":1756154674000},"page":"1-13","source":"Crossref","is-referenced-by-count":12,"title":["A High-Performance and Enhanced Generalization Small Target Defect Detection Method for PCB Boards Based on YOLO-EMAC"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0003-9912-714X","authenticated-orcid":false,"given":"Han","family":"Wu","sequence":"first","affiliation":[{"name":"School of Computer Science and Technology, Wuhan University of Science and Technology, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2779-2637","authenticated-orcid":false,"given":"Yunhan","family":"Lin","sequence":"additional","affiliation":[{"name":"School of Computer Science and Technology, Wuhan University of Science and Technology, Wuhan, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3551584"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3106057"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/ma13245755"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2019.101004"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2717284"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s10044-017-0640-9"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2016.2577031"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46448-0_2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3208580"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3001349"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2023.106359"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3326460"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MVIP49855.2020.9187485"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3232649"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3154814"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1155\/2021\/7550670"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3351241"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-024-57491-3"},{"key":"ref19","article-title":"YOLOv12: Attention-centric real-time object detectors","author":"Tian","year":"2025","journal-title":"arXiv:2502.12524"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3544321"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3550210"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3153997"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2020.103615"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3390198"},{"key":"ref25","article-title":"A PCB dataset for defects detection and classification","author":"Huang","year":"2019","journal-title":"arXiv:1901.08204"},{"key":"ref26","article-title":"Online PCB defect detector on a new PCB defect dataset","author":"Tang","year":"2019","journal-title":"arXiv:1902.06197"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3386210"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1049\/joe.2019.1183"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.01392"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2023.3339561"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3322483"},{"key":"ref32","first-page":"527","article-title":"A real-time PCB defect detector based on supervised and semi-supervised learning","volume-title":"Proc. ESANN","author":"He"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11141402.pdf?arnumber=11141402","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,5]],"date-time":"2025-09-05T06:24:49Z","timestamp":1757053489000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11141402\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":32,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3602542","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}