{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,18]],"date-time":"2026-01-18T04:09:41Z","timestamp":1768709381686,"version":"3.49.0"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"CUI CAN Program of Guangdong Province","award":["CC\/XM-202402ZJ0601"],"award-info":[{"award-number":["CC\/XM-202402ZJ0601"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3608344","type":"journal-article","created":{"date-parts":[[2025,9,10]],"date-time":"2025-09-10T17:45:38Z","timestamp":1757526338000},"page":"1-12","source":"Crossref","is-referenced-by-count":0,"title":["Multiscale Edge-Enhanced Deep Learning for Cable Connection Visual Inspection of Low-Voltage Switchgear"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-3872-9246","authenticated-orcid":false,"given":"Yigeng","family":"Wang","sequence":"first","affiliation":[{"name":"School of Information Engineering, Guangdong University of Technology, Guangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-1977-3375","authenticated-orcid":false,"given":"Feng","family":"Zou","sequence":"additional","affiliation":[{"name":"School of Information Engineering, Guangdong University of Technology, Guangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-9185-3657","authenticated-orcid":false,"given":"Lexuan","family":"Lai","sequence":"additional","affiliation":[{"name":"School of Information Engineering, Guangdong University of Technology, Guangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9757-5748","authenticated-orcid":false,"given":"Nian","family":"Cai","sequence":"additional","affiliation":[{"name":"School of Information Engineering, Guangdong University of Technology, Guangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-5250-7529","authenticated-orcid":false,"given":"Wenzhao","family":"Liang","sequence":"additional","affiliation":[{"name":"China Unicom (Guangdong) Industrial Internet Company Ltd., Guangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/SUMMA60232.2023.10349643"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2021.9399911"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.4324\/9780080458496"},{"key":"ref4","first-page":"15","article-title":"Inspection and testing of electrical installations","volume-title":"Proc. 3rd Int. Conf. Installation Eng. Designing Maintaining Successful Syst.","author":"Garnham"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2014.2360233"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1049\/icp.2023.3302"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2023.3328876"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00584"},{"key":"ref9","article-title":"Openpose: Whole-body pose estimation","author":"Mart\u00ednez","year":"2019"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2014.214"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW56347.2022.00297"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2016.2603342"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/I2CT57861.2023.10126381"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.450"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3413196"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v38i4.28180"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/WACV56688.2023.00015"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2022.3145820"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2023.3307889"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2022.3155927"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3271000"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/3DV62453.2024.00035"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46493-0_38"},{"key":"ref24","article-title":"Decoupled weight decay regularization","author":"Loshchilov","year":"2017","journal-title":"arXiv:1711.05101"},{"key":"ref25","first-page":"249","article-title":"Understanding the difficulty of training deep feedforward neural networks","volume-title":"Proc. 13th Int. Conf. Artif. Intell. Statist.","author":"Glorot"},{"key":"ref26","first-page":"8026","article-title":"PyTorch: An imperative style, high-performance deep learning library","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","author":"Paszke"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.21105\/joss.00205"},{"key":"ref28","first-page":"47","article-title":"A new shared nearest neighbor clustering algorithm and its applications","volume-title":"Proc. Workshop Clustering High Dimensional Data Appl. 2nd SIAM Int. Conf. Data Mining","volume":"8","author":"Ertoz"},{"key":"ref29","volume-title":"Ultralytics YOLO","author":"Jocher","year":"2024"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.106"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1023\/b:visi.0000029664.99615.94"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2011.6126544"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2017.2765830"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.procs.2023.12.195"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11156102.pdf?arnumber=11156102","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,19]],"date-time":"2025-09-19T04:50:23Z","timestamp":1758257423000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11156102\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3608344","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}