{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T00:06:36Z","timestamp":1783641996849,"version":"3.55.0"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["12172015"],"award-info":[{"award-number":["12172015"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["11772014"],"award-info":[{"award-number":["11772014"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62403019"],"award-info":[{"award-number":["62403019"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2022YFC3005000"],"award-info":[{"award-number":["2022YFC3005000"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3608351","type":"journal-article","created":{"date-parts":[[2025,9,10]],"date-time":"2025-09-10T17:45:38Z","timestamp":1757526338000},"page":"1-16","source":"Crossref","is-referenced-by-count":5,"title":["Optimization of HBVD-EMAT Based on Orthogonal Experimental and Multilayer Perceptron Fusion Method"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1219-6496","authenticated-orcid":false,"given":"Yanhong","family":"Guo","sequence":"first","affiliation":[{"name":"College of Mechanical and Energy Engineering, Beijing University of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6357-7312","authenticated-orcid":false,"given":"Zenghua","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, Beijing University of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6023-8948","authenticated-orcid":false,"given":"Mengqi","family":"Su","sequence":"additional","affiliation":[{"name":"College of Mechanical and Energy Engineering, Beijing University of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-4196-4726","authenticated-orcid":false,"given":"Jinjie","family":"Cheng","sequence":"additional","affiliation":[{"name":"College of Mechanical and Energy Engineering, Beijing University of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-6031-6133","authenticated-orcid":false,"given":"Kunsong","family":"Zheng","sequence":"additional","affiliation":[{"name":"College of Mechanical and Energy Engineering, Beijing University of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5256-5335","authenticated-orcid":false,"given":"Yang","family":"Zheng","sequence":"additional","affiliation":[{"name":"Key Laboratory of Nondestructive Testing and Evaluation for State Market Regulation, China Special Equipment Inspection and Research Institute, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-4668-2050","authenticated-orcid":false,"given":"Xin","family":"Zhao","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, Beijing University of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3798-4723","authenticated-orcid":false,"given":"Cunfu","family":"He","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, Beijing University of Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2017.01.009"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2021.102525"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1177\/14759217221135651"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1080\/10589759.2023.2221770"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmrt.2023.07.238"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3154809"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3314818"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2021.102572"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2023.102900"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3062421"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3238689"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3201988"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3328854"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultras.2017.02.009"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3348477"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2021.3049507"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2021.3055871"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2016.07.006"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2021.102501"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TUFFC.2013.2864"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s10921-021-00771-z"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.3390\/s23083943"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1049\/el:19930435"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3244850"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3053343"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2013.05.003"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.2307\/1270278"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2020.112109"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2863546"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3073713"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.3390\/s22020524"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2020.107337"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/0925-2312(91)90023-5"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.ceramint.2018.06.010"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11156129.pdf?arnumber=11156129","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,17]],"date-time":"2025-09-17T17:30:37Z","timestamp":1758130237000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11156129\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":34,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3608351","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"value":"0018-9456","type":"print"},{"value":"1557-9662","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025]]}}}