{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,4]],"date-time":"2025-10-04T00:21:34Z","timestamp":1759537294092,"version":"build-2065373602"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52475239"],"award-info":[{"award-number":["52475239"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Instrum. Meas."],"published-print":{"date-parts":[[2025]]},"DOI":"10.1109\/tim.2025.3612647","type":"journal-article","created":{"date-parts":[[2025,9,22]],"date-time":"2025-09-22T17:44:05Z","timestamp":1758563045000},"page":"1-11","source":"Crossref","is-referenced-by-count":0,"title":["Decoupled Online Q-Learning Design for MIMO Active Magnetic Compensation Systems"],"prefix":"10.1109","volume":"74","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4804-637X","authenticated-orcid":false,"given":"Jinji","family":"Sun","sequence":"first","affiliation":[{"name":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-3679-6744","authenticated-orcid":false,"given":"Yang","family":"Gao","sequence":"additional","affiliation":[{"name":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1468-9630","authenticated-orcid":false,"given":"Jianyi","family":"Ren","sequence":"additional","affiliation":[{"name":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-6732-5517","authenticated-orcid":false,"given":"Haofan","family":"Wang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Ultra-Weak Magnetic Field Measurement Technology, Ministry of Education, School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8078-3070","authenticated-orcid":false,"given":"Daiyong","family":"Chen","sequence":"additional","affiliation":[{"name":"Hangzhou Institute of National Extremely-Weak Magnetic Field Infrastructure, Hangzhou, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s11214-010-9676-5"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s11431-018-9247-6"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1038\/nn.4504"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/nature26147"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1364\/oe.25.007849"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1140\/epjc\/s10052-024-13544-5"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2024.114594"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2021.3125561"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2022.3159961"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3440403"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3394482"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1140\/epjc\/s10052-023-12225-z"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/jas.2023.123843"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tcyb.2024.3440333"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tnnls.2018.2861945"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/tnnls.2022.3230200"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tcyb.2018.2853582"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tii.2023.3346468"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/tcyb.2023.3324601"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2006.09.019"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2008.08.017"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/tnnls.2013.2281663"}],"container-title":["IEEE Transactions on Instrumentation and Measurement"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/19\/10764799\/11175268.pdf?arnumber=11175268","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,3]],"date-time":"2025-10-03T04:16:55Z","timestamp":1759465015000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11175268\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/tim.2025.3612647","relation":{},"ISSN":["0018-9456","1557-9662"],"issn-type":[{"type":"print","value":"0018-9456"},{"type":"electronic","value":"1557-9662"}],"subject":[],"published":{"date-parts":[[2025]]}}}