{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,3,15]],"date-time":"2024-03-15T04:26:05Z","timestamp":1710476765601},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2016,3,1]],"date-time":"2016-03-01T00:00:00Z","timestamp":1456790400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. on Image Process."],"published-print":{"date-parts":[[2016,3]]},"DOI":"10.1109\/tip.2016.2524213","type":"journal-article","created":{"date-parts":[[2016,2,3]],"date-time":"2016-02-03T19:11:27Z","timestamp":1454526687000},"page":"1441-1450","source":"Crossref","is-referenced-by-count":2,"title":["Filtering Chromatic Aberration for Wide Acceptance Angle Electrostatic Lenses II\u2014Experimental Evaluation and Software-Based Imaging Energy Analyzer"],"prefix":"10.1109","volume":"25","author":[{"given":"Adam","family":"Fazekas","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hiroshi","family":"Daimon","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hiroyuki","family":"Matsuda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Laszlo","family":"Toth","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.elspec.2009.02.013"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2010.12.192"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1380\/ejssnt.2011.311"},{"key":"ref13","article-title":"Development of high-energy-resolution display-type photoelectron spectrometer for microanalysis","author":"daimon","year":"0"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2011.09.018"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.elspec.2014.05.001"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.elspec.2014.05.013"},{"key":"ref17","doi-asserted-by":"crossref","first-page":"123","DOI":"10.14232\/actacyb.21.1.2013.9","article-title":"Elimination of the background of electron microscope images by using FPGA","volume":"21","author":"fazekas","year":"2013","journal-title":"Acta Cybern"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2014.2321493"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511623172"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1116\/1.1523373"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/0039-6028(89)90380-4"},{"key":"ref3","author":"orloff","year":"2009","journal-title":"Handbook of Charged Particle Optics"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevE.74.036501"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevE.71.066503"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.susc.2007.05.059"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevE.75.046402"},{"key":"ref2","article-title":"The motion of charges in electric and magnetic fields, 29-5 The electron microscope","volume":"2","author":"feynman","year":"1964","journal-title":"The Feynman Lectures on Physics"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3131\/jvsj2.51.135"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0508-3443\/13\/5\/303"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1086\/143226"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1063\/1.3243762"},{"key":"ref21","year":"2015","journal-title":"Stainless Steel—Grade 316L—Properties Fabrication and Applications (UNS S31603)"},{"key":"ref24","year":"2013","journal-title":"MCP & MCP ASSEMBLY-SELECTION GUDE"},{"key":"ref23","year":"2014","journal-title":"Electron Guns G10 Series"},{"key":"ref26","year":"2015","journal-title":"Sensicam QE"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.5.4709"}],"container-title":["IEEE Transactions on Image Processing"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/83\/7383373\/07398071.pdf?arnumber=7398071","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:01:32Z","timestamp":1642003292000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7398071\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,3]]},"references-count":27,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tip.2016.2524213","relation":{},"ISSN":["1057-7149","1941-0042"],"issn-type":[{"value":"1057-7149","type":"print"},{"value":"1941-0042","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,3]]}}}