{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,27]],"date-time":"2026-02-27T21:28:37Z","timestamp":1772227717235,"version":"3.50.1"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62371389"],"award-info":[{"award-number":["62371389"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62272383"],"award-info":[{"award-number":["62272383"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62031023"],"award-info":[{"award-number":["62031023"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. on Image Process."],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/tip.2026.3662579","type":"journal-article","created":{"date-parts":[[2026,2,13]],"date-time":"2026-02-13T20:52:17Z","timestamp":1771015937000},"page":"2235-2248","source":"Crossref","is-referenced-by-count":0,"title":["Robust 2.5D Feature Matching in Light Fields via a Learnable Parameterized Depth-Degraded Projection"],"prefix":"10.1109","volume":"35","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8492-9516","authenticated-orcid":false,"given":"Meng","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Computer Science and Engineering, Xi’an University of Technology, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3742-4029","authenticated-orcid":false,"given":"Haiyan","family":"Jin","sequence":"additional","affiliation":[{"name":"School of Computer Science and Engineering, Xi’an University of Technology, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2457-5944","authenticated-orcid":false,"given":"Zhaolin","family":"Xiao","sequence":"additional","affiliation":[{"name":"School of Computer Science and Engineering, Xi’an University of Technology, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2926-0415","authenticated-orcid":false,"given":"Jinglei","family":"Shi","sequence":"additional","affiliation":[{"name":"College of Computer Science, Nankai Unversity, Tianjin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3030-4227","authenticated-orcid":false,"given":"Xiaoran","family":"Jiang","sequence":"additional","affiliation":[{"name":"INSA Rennes, Rennes, France"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.01309"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIV.2024.3357056"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1017\/S096249291700006X"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/robotics11010024"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00823"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP42928.2021.9506361"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2022.3202099"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1023\/b:visi.0000029664.99615.94"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00499"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.00881"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/electronics9050741"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2854262"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW.2014.71"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2019.2922099"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/11744023_32"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2011.6126544"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46466-4_28"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW.2018.00060"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW63382.2024.00428"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00828"},{"key":"ref21","first-page":"12405","article-title":"R2D2: Reliable and repeatable detector and descriptor","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"32","author":"Revaud"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v36i2.20138"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.649"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.01878"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00282"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01342"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.12"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298948"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2014.7025386"},{"issue":"16","key":"ref30","article-title":"Disparity-guided matching metric method for light field features (invited)","volume":"61","author":"Zhang","year":"2024","journal-title":"Laser Optoelectronics Prog."},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.5244\/C.2.23"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.302"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV51070.2023.01616"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW53098.2021.00484"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00624"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-19824-3_2"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.02047"}],"container-title":["IEEE Transactions on Image Processing"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/83\/11355710\/11396435.pdf?arnumber=11396435","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,27]],"date-time":"2026-02-27T20:51:49Z","timestamp":1772225509000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11396435\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":37,"URL":"https:\/\/doi.org\/10.1109\/tip.2026.3662579","relation":{},"ISSN":["1057-7149","1941-0042"],"issn-type":[{"value":"1057-7149","type":"print"},{"value":"1941-0042","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026]]}}}