{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,16]],"date-time":"2026-05-16T02:47:23Z","timestamp":1778899643631,"version":"3.51.4"},"reference-count":43,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T00:00:00Z","timestamp":1759276800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T00:00:00Z","timestamp":1759276800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T00:00:00Z","timestamp":1759276800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61972241"],"award-info":[{"award-number":["61972241"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100007219","name":"Natural Science Foundation of Shanghai","doi-asserted-by":"publisher","award":["24ZR1427500"],"award-info":[{"award-number":["24ZR1427500"]}],"id":[{"id":"10.13039\/100007219","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100007219","name":"Natural Science Foundation of Shanghai","doi-asserted-by":"publisher","award":["22ZR1427100"],"award-info":[{"award-number":["22ZR1427100"]}],"id":[{"id":"10.13039\/100007219","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Soft Science Project of Shanghai","award":["25692107400"],"award-info":[{"award-number":["25692107400"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Knowl. Data Eng."],"published-print":{"date-parts":[[2025,10]]},"DOI":"10.1109\/tkde.2025.3589885","type":"journal-article","created":{"date-parts":[[2025,7,16]],"date-time":"2025-07-16T17:40:09Z","timestamp":1752687609000},"page":"5905-5918","source":"Crossref","is-referenced-by-count":14,"title":["GAN-Based Hybrid Sampling Method for Transaction Fraud Detection"],"prefix":"10.1109","volume":"37","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0928-3823","authenticated-orcid":false,"given":"Yu","family":"Xie","sequence":"first","affiliation":[{"name":"College of Information Engineering, Shanghai Maritime University, Shanghai, China"}]},{"given":"Junkai","family":"Shan","sequence":"additional","affiliation":[{"name":"College of Information Engineering, Shanghai Maritime University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0243-9995","authenticated-orcid":false,"given":"Lifei","family":"Wei","sequence":"additional","affiliation":[{"name":"College of Information Engineering, Shanghai Maritime University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7269-2064","authenticated-orcid":false,"given":"Jiamin","family":"Yao","sequence":"additional","affiliation":[{"name":"College of Information Engineering, Shanghai Maritime University, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5408-8752","authenticated-orcid":false,"given":"MengChu","family":"Zhou","sequence":"additional","affiliation":[{"name":"School of Information and Electronic Engineering, Zhejiang Gongshang University, Hangzhou, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2021.3098702"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSS.2023.3257227"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TAI.2024.3359568"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1155\/2018\/5680264"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2023.3335145"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSS.2023.3243925"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.bar.2024.101441"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2019.07.006"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2022.07.145"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.knosys.2023.110795"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2022.3208967"},{"issue":"86","key":"ref12","first-page":"2579","article-title":"Visualizing data using t-SNE","volume":"9","author":"van der Maaten","year":"2008","journal-title":"J. Mach. Learn. Res."},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSS.2023.3242149"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2022.105621"},{"issue":"5","key":"ref15","first-page":"1017","article-title":"Oversampling method for imbalanced classification","volume":"34","author":"Zheng","year":"2015","journal-title":"Comput. Informat."},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1613\/jair.953"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2023.3335241"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/11538059_91"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2022.3185316"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.ipm.2022.103235"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TBDATA.2024.3442534"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2017.2755595"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2024.120263"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ab.2020.113592"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCBB.2021.3095482"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2014.2372060"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2022.109008"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2020.2985965"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2024.3384274"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2020.06.026"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2022.3225516"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2022.3170643"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TNSM.2022.3226505"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.mlwa.2021.100220"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2024.124806"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3234095"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2022.3194886"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TCSS.2019.2898774"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2021.3072357"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2008.4633969"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2019.1911447"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2022.3171549"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2023.124008"}],"container-title":["IEEE Transactions on Knowledge and Data Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/69\/11163535\/11081459.pdf?arnumber=11081459","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,9,13]],"date-time":"2025-09-13T05:42:14Z","timestamp":1757742134000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11081459\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10]]},"references-count":43,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tkde.2025.3589885","relation":{},"ISSN":["1041-4347","1558-2191","2326-3865"],"issn-type":[{"value":"1041-4347","type":"print"},{"value":"1558-2191","type":"electronic"},{"value":"2326-3865","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,10]]}}}