{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T16:50:53Z","timestamp":1783702253433,"version":"3.55.0"},"reference-count":47,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Knowl. Data Eng."],"published-print":{"date-parts":[[2026,1]]},"DOI":"10.1109\/tkde.2025.3626561","type":"journal-article","created":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T17:37:57Z","timestamp":1761673077000},"page":"442-456","source":"Crossref","is-referenced-by-count":1,"title":["MMM: A Unified Weakly-Supervised Anomaly Detection Framework for Multi-Distributional Data"],"prefix":"10.1109","volume":"38","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6457-5407","authenticated-orcid":false,"given":"Xu","family":"Tan","sequence":"first","affiliation":[{"name":"School of Marine Science and Technology, Northwestern Polytechnical University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Junqi","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Marine Science and Technology, Northwestern Polytechnical University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2521-2256","authenticated-orcid":false,"given":"Jiawei","family":"Yang","sequence":"additional","affiliation":[{"name":"Department of Computing, University of Turku, Turku, Finland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2306-8860","authenticated-orcid":false,"given":"Jie","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Marine Science and Technology, Northwestern Polytechnical University, Xi’an, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0831-6934","authenticated-orcid":false,"given":"Susanto","family":"Rahardja","sequence":"additional","affiliation":[{"name":"College of Information Science & Electronic Engineering, Zhejiang University, Hangzhou, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1969.10490657"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2021.116429"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tkde.2021.3050400"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3464423"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/rs14215394"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/s10618-015-0444-8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tkde.2013.108"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.2139\/ssrn.4266498"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3522690"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/3580305.3599302"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tcyb.2022.3227044"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tmm.2025.3557682"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/3292500.3330871"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tnnls.2021.3086137"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v38i8.28682"},{"key":"ref16","first-page":"1","article-title":"Robustness evaluation of deep unsupervised learning algorithms for intrusion detection systems","volume-title":"Proc. ICML Workshop Mach. Learn. Cybersecur.","author":"Nkashama","year":"2022"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/icspcc62635.2024.10770302"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tpami.2019.2945574"},{"key":"ref19","first-page":"1","article-title":"Deep semi-supervised anomaly detection","volume-title":"Proc. Int. Conf. Learn. Representations","author":"Ruff","year":"2020"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/tnnls.2021.3095150"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.5244\/C.35.90"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/3219819.3220042"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.24963\/ijcai.2022\/313"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/3696410.3714626"},{"key":"ref25","first-page":"51","article-title":"Learning outlier ensembles: The best of both worlds\u2013Supervised and unsupervised","volume-title":"Proc. ACM SIGKDD Workshop Outlier Detect. Descr. Data Divers","author":"Micenkov\u00e1","year":"2014"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ijcnn.2018.8489605"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/3580305.3599302"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.ipm.2023.103459"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/tfuzz.2024.3412435"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2024.125597"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/iccv.2019.00179"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/3503161.3548082"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/iccv.2019.00654"},{"key":"ref34","article-title":"Auto-encoding variational Bayes","author":"Kingma","year":"2013"},{"key":"ref35","first-page":"1","article-title":"Deep autoencoding Gaussian mixture model for unsupervised anomaly detection","volume-title":"Proc. Int. Conf. Learn. Representations","author":"Zong","year":"2018"},{"key":"ref36","first-page":"1195","article-title":"Mean teachers are better role models: Weight-averaged consistency targets improve semi-supervised deep learning results","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"30","author":"Tarvainen","year":"2017"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2021.10.008"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/tkde.2023.3332757"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.24963\/ijcai.2017\/273"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/s11222-007-9033-z"},{"key":"ref41","first-page":"857","article-title":"Stochastic neighbor embedding","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"15","author":"Hinton","year":"2002"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/tkde.2024.3349613"},{"issue":"86","key":"ref43","first-page":"2579","article-title":"Visualizing data using t-SNE","volume":"9","author":"Maaten","year":"2008","journal-title":"J. Mach. Learn. Res."},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/tkde.2024.3393996"},{"key":"ref45","first-page":"1","article-title":"Adam: A method for stochastic optimization","volume-title":"Proc. Int. Conf. Learn. Representations","author":"Kingma","year":"2015"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/tsmc.2021.3049490"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2024.102587"}],"container-title":["IEEE Transactions on Knowledge and Data Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/69\/11288926\/11219281.pdf?arnumber=11219281","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,12,11]],"date-time":"2025-12-11T03:56:17Z","timestamp":1765425377000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11219281\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,1]]},"references-count":47,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tkde.2025.3626561","relation":{},"ISSN":["1041-4347","1558-2191","2326-3865"],"issn-type":[{"value":"1041-4347","type":"print"},{"value":"1558-2191","type":"electronic"},{"value":"2326-3865","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,1]]}}}