{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T20:41:37Z","timestamp":1777668097229,"version":"3.51.4"},"reference-count":55,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61571321"],"award-info":[{"award-number":["61571321"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61871356"],"award-info":[{"award-number":["61871356"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100006606","name":"Natural Science Foundation of Tianjin City","doi-asserted-by":"publisher","award":["17JCQNJC03500"],"award-info":[{"award-number":["17JCQNJC03500"]}],"id":[{"id":"10.13039\/501100006606","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Med. Imaging"],"published-print":{"date-parts":[[2019,10]]},"DOI":"10.1109\/tmi.2019.2900031","type":"journal-article","created":{"date-parts":[[2019,2,19]],"date-time":"2019-02-19T19:25:33Z","timestamp":1550604333000},"page":"2400-2410","source":"Crossref","is-referenced-by-count":62,"title":["A Statistical Shape-Constrained Reconstruction Framework for Electrical Impedance Tomography"],"prefix":"10.1109","volume":"38","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2220-3856","authenticated-orcid":false,"given":"Shangjie","family":"Ren","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8718-1913","authenticated-orcid":false,"given":"Kai","family":"Sun","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9645-7683","authenticated-orcid":false,"given":"Dong","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8478-8928","authenticated-orcid":false,"given":"Feng","family":"Dong","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1002\/9781119072492"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1007\/s10278-013-9622-7"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1118\/1.4873326"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/15\/3\/306"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCI.2018.2863038"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2857839"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2015.2445575"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1038\/srep25951"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/31\/8\/S02"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1186\/1475-925X-5-8"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1080\/17415970500264152"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.jcp.2004.11.022"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2017.2756078"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2016.2640944"},{"key":"ref1","author":"holder","year":"2005","journal-title":"Electrical Impedance Tomography Methods History and Applications"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.cam.2011.09.035"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2006.887367"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2816739"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1080\/17415977.2017.1378195"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/29\/1\/015005"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/16\/5\/303"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2853358"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/13\/12\/310"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/36\/6\/1161"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6420\/aa59d0"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2015.2509508"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1016\/S1004-9541(12)60400-5"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2828303"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/25\/2\/025001"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3934\/ipi.2015.9.211"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.1979.4310076"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3934\/ipi.2017020"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1163\/156939309789476301"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/9781119311997"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2019.2891676"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2876411"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/42.700740"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2014.2351014"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/26\/12\/125401"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2864539"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.neuroimage.2015.08.071"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/30\/4\/006"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1136\/thoraxjnl-2016-208357"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1097\/CCM.0b013e318236f452"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2012.2183641"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/25\/1\/021"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/ima.1850020203"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1137\/080716542"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1007\/s10107-010-0394-2"},{"key":"ref48","first-page":"372","article-title":"A method of solving a convex programming problem with convergence rate \n$O(1\/k^{2})$","volume":"27","author":"nesterov","year":"1983","journal-title":"Soviet Math Doklady"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1016\/j.acha.2009.04.002"},{"key":"ref42","first-page":"2080","article-title":"Robust principal component analysis: Exact recovery of corrupted low-rank matrices via convex optimization","author":"wright","year":"2009","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1007\/BF02291478"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2013.03.003"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2015.2445572"}],"container-title":["IEEE Transactions on Medical Imaging"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/42\/8854342\/08644002.pdf?arnumber=8644002","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T20:49:44Z","timestamp":1657745384000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8644002\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10]]},"references-count":55,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tmi.2019.2900031","relation":{},"ISSN":["0278-0062","1558-254X"],"issn-type":[{"value":"0278-0062","type":"print"},{"value":"1558-254X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,10]]}}}