{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,7]],"date-time":"2026-04-07T09:37:43Z","timestamp":1775554663973,"version":"3.50.1"},"reference-count":46,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key R&D Program of China","award":["2018AAA0101400"],"award-info":[{"award-number":["2018AAA0101400"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62022063"],"award-info":[{"award-number":["62022063"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61772388"],"award-info":[{"award-number":["61772388"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61632019"],"award-info":[{"award-number":["61632019"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Multimedia"],"published-print":{"date-parts":[[2022]]},"DOI":"10.1109\/tmm.2021.3107148","type":"journal-article","created":{"date-parts":[[2021,8,25]],"date-time":"2021-08-25T19:53:30Z","timestamp":1629921210000},"page":"3754-3768","source":"Crossref","is-referenced-by-count":9,"title":["Video Quality Assessment With Serial Dependence Modeling"],"prefix":"10.1109","volume":"24","author":[{"given":"Yongxu","family":"Liu","sequence":"first","affiliation":[{"name":"School of Artificial Intelligence, Xidian University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7501-0009","authenticated-orcid":false,"given":"Jinjian","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Artificial Intelligence, Xidian University, Xi’an, China"}]},{"given":"Aobo","family":"Li","sequence":"additional","affiliation":[{"name":"School of Artificial Intelligence, Xidian University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9069-8796","authenticated-orcid":false,"given":"Leida","family":"Li","sequence":"additional","affiliation":[{"name":"School of Artificial Intelligence, Xidian University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9632-985X","authenticated-orcid":false,"given":"Weisheng","family":"Dong","sequence":"additional","affiliation":[{"name":"School of Artificial Intelligence, Xidian University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2179-3292","authenticated-orcid":false,"given":"Guangming","family":"Shi","sequence":"additional","affiliation":[{"name":"School of Artificial Intelligence, Xidian University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9866-1947","authenticated-orcid":false,"given":"Weisi","family":"Lin","sequence":"additional","affiliation":[{"name":"School of Computer Engineering, Nanyang Technological University, Singapore, Singapore"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSTSP.2016.2608329"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ACSSC.2003.1292216"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2017.2651410"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2012.2214933"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2017.2729020"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2014.2299154"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2019.2900472"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1364\/JOSAA.24.000B61"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2017.2726542"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2009.2034992"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2017.04.031"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2012.2186745"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2016.08.143"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1117\/1.JEI.23.1.013016"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2016.2548247"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2019.2908377"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2019.2929009"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2018.2890310"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01246-5_14"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP40776.2020.9053031"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1038\/nn.3689"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.cub.2014.09.025"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.tics.2017.04.011"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1038\/nrn3863"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2016.2525004"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2012.2190589"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSTSP.2009.2014806"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2012.2219551"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2011.5946613"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/3343031.3351028"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2019.8803395"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP40778.2020.9191169"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1177\/0956797615595037"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2012.59"},{"key":"ref35","first-page":"568","article-title":"Two-stream convolutional networks for action recognition in videos","volume-title":"Proc. 27th Int. Conf. Neural Inf. Process. Syst","author":"Simonyan","year":"2014"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.3758\/BF03207553"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/S0042-6989(99)00166-2"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2013.2293423"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/S0042-6989(97)00183-1"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-45103-X_50"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2010.2042111"},{"key":"ref42","first-page":"5998","article-title":"Attention is all you need","volume-title":"Proc. Annu. Conf. Neural Inf. Process. Syst","author":"Vaswani","year":"2017"},{"key":"ref43","article-title":"IVP subjective quality video database","volume-title":"The Chin. Univ. Hong Kong","author":"Zhang"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1117\/12.912180"},{"issue":"TM-11-482","key":"ref45","article-title":"Video quality model for variable frame delay (VQM_VFD)","author":"Wolf","year":"2011","journal-title":"U.S. Dept. Commer., Nat. Telecommun. Inf. Admin."},{"issue":"2","key":"ref46","article-title":"Toward a practical perceptual video quality metric","volume":"6","author":"Li","year":"2016","journal-title":"Netflix Tech Blog"}],"container-title":["IEEE Transactions on Multimedia"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6046\/9687854\/09522100.pdf?arnumber=9522100","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T22:49:33Z","timestamp":1705013373000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9522100\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022]]},"references-count":46,"URL":"https:\/\/doi.org\/10.1109\/tmm.2021.3107148","relation":{},"ISSN":["1520-9210","1941-0077"],"issn-type":[{"value":"1520-9210","type":"print"},{"value":"1941-0077","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022]]}}}