{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:14:21Z","timestamp":1740132861939,"version":"3.37.3"},"reference-count":46,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61972240"],"award-info":[{"award-number":["61972240"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003399","name":"Science and Technology Commission of Shanghai Municipality","doi-asserted-by":"publisher","award":["20050501900"],"award-info":[{"award-number":["20050501900"]}],"id":[{"id":"10.13039\/501100003399","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Multimedia"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tmm.2022.3225738","type":"journal-article","created":{"date-parts":[[2022,12,1]],"date-time":"2022-12-01T00:21:26Z","timestamp":1669854086000},"page":"7726-7735","source":"Crossref","is-referenced-by-count":2,"title":["Ranked Similarity Weighting and Top-nk Sampling in Deep Metric Learning"],"prefix":"10.1109","volume":"25","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0337-2657","authenticated-orcid":false,"given":"Jian","family":"Wang","sequence":"first","affiliation":[{"name":"Institute of Digital Ocean, Shanghai Ocean University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xinyue","family":"Li","sequence":"additional","affiliation":[{"name":"Institute of Digital Ocean, Shanghai Ocean University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1466-6383","authenticated-orcid":false,"given":"Zhichao","family":"Zhang","sequence":"additional","affiliation":[{"name":"Institute of Digital Ocean, Shanghai Ocean University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0604-5563","authenticated-orcid":false,"given":"Wei","family":"Song","sequence":"additional","affiliation":[{"name":"Institute of Digital Ocean, Shanghai Ocean University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Weiqi","family":"Guo","sequence":"additional","affiliation":[{"name":"East Sea Oceanographic Engineering Investigation, Design and Research Institute, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2021.3050089"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2016.2646180"},{"key":"ref3","article-title":"A hierarchical sampling based triplet network for fine-grained image classification","volume-title":"Pattern Recognit.","volume":"115","author":"He","year":"2021"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2020.2973812"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2021.3109508"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2017.358"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2020.3031625"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2019.2929957"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2020.2974326"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2015.2477035"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-58545-7_39"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298682"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.434"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00535"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2006.100"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICCVW.2017.194"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMM.2020.2972125"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s00500-020-04880-1"},{"key":"ref19","first-page":"1857","article-title":"Improved deep metric learning with multi-class n-pair loss objective","volume":"29","author":"Sohn","year":"2016"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.145"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00516"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00643"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICPR.2014.16"},{"key":"ref24","first-page":"4177","article-title":"Learning deep embeddings with histogram loss","volume-title":"Proc. 30th Int. Conf. Neural Inf. Process. Syst.","author":"Ustinova","year":"2016"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.283"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00330"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.307"},{"key":"ref28","first-page":"1002","article-title":"Active bias: Training more accurate neural networks by emphasizing high variance samples","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"30","author":"Chang","year":"2017"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298682"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01231-1_17"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2015.22"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.309"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00805"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01460"},{"issue":"1","key":"ref35","first-page":"3221","article-title":"Accelerating t-SNE using tree-based algorithms","volume":"15","author":"Maaten","year":"2014","journal-title":"J. Mach. Learn. Res."},{"article-title":"The Caltech-UCSD Birds-200-2011 Dataset","year":"2011","author":"Wah","key":"ref36"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ICCVW.2013.77"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.124"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.47"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.94"},{"key":"ref41","first-page":"2037","article-title":"Deep adversarial metric learning","volume-title":"IEEE Trans. Image Process.","volume":"29","author":"Duan","year":"2020"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01246-5_45"},{"issue":"2","key":"ref43","first-page":"276","article-title":"Deep metric learning with BIER: Boosting independent embeddings robustly","volume-title":"IEEE Trans. Pattern Anal. Mach. Intell.","volume":"42","author":"Opitz","year":"2020"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2019.00016"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00659"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.237"}],"container-title":["IEEE Transactions on Multimedia"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6046\/10016790\/09966831.pdf?arnumber=9966831","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,12,19]],"date-time":"2023-12-19T22:58:34Z","timestamp":1703026714000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9966831\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":46,"URL":"https:\/\/doi.org\/10.1109\/tmm.2022.3225738","relation":{},"ISSN":["1520-9210","1941-0077"],"issn-type":[{"type":"print","value":"1520-9210"},{"type":"electronic","value":"1941-0077"}],"subject":[],"published":{"date-parts":[[2023]]}}}