{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,6]],"date-time":"2026-05-06T19:47:35Z","timestamp":1778096855923,"version":"3.51.4"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2024,5,1]],"date-time":"2024-05-01T00:00:00Z","timestamp":1714521600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,5,1]],"date-time":"2024-05-01T00:00:00Z","timestamp":1714521600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,1]],"date-time":"2024-05-01T00:00:00Z","timestamp":1714521600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Natural Science Fund for Distinguished Young Scholars","award":["61925305"],"award-info":[{"award-number":["61925305"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61973119"],"award-info":[{"award-number":["61973119"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100013105","name":"Shanghai Rising-Star Program","doi-asserted-by":"publisher","award":["20QA1402600"],"award-info":[{"award-number":["20QA1402600"]}],"id":[{"id":"10.13039\/501100013105","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Neural Netw. Learning Syst."],"published-print":{"date-parts":[[2024,5]]},"DOI":"10.1109\/tnnls.2023.3242361","type":"journal-article","created":{"date-parts":[[2023,2,16]],"date-time":"2023-02-16T20:34:53Z","timestamp":1676579693000},"page":"6218-6230","source":"Crossref","is-referenced-by-count":23,"title":["Partial Cross Mapping Based on Sparse Variable Selection for Direct Fault Root Cause Diagnosis for Industrial Processes"],"prefix":"10.1109","volume":"35","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3402-9018","authenticated-orcid":false,"given":"Qingchao","family":"Jiang","sequence":"first","affiliation":[{"name":"Key Laboratory of Smart Manufacturing in Energy Chemical Process, Ministry of Education, East China University of Science and Technology, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4346-8802","authenticated-orcid":false,"given":"Jiashi","family":"Jiang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Smart Manufacturing in Energy Chemical Process, Ministry of Education, East China University of Science and Technology, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0082-7847","authenticated-orcid":false,"given":"Wenjing","family":"Wang","sequence":"additional","affiliation":[{"name":"Key Laboratory of Smart Manufacturing in Energy Chemical Process, Ministry of Education, East China University of Science and Technology, Shanghai, China"}]},{"given":"Chunjian","family":"Pan","sequence":"additional","affiliation":[{"name":"College of Automation Engineering, Shanghai University of Electric Power, Shanghai, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4285-4739","authenticated-orcid":false,"given":"Weimin","family":"Zhong","sequence":"additional","affiliation":[{"name":"Key Laboratory of Smart Manufacturing in Energy Chemical Process, Ministry of Education, East China University of Science and Technology, Shanghai, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2017.06.012"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301773"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2019.2958184"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2018.07.012"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.9b02391"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-021-22919-1"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2020.2985223"},{"key":"ref8","volume-title":"Fault Detection and Diagnosis in Industrial Systems","author":"Chiang","year":"2002"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2860571"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1099-128X(199809\/10)12:5<301::AID-CEM515>3.0.CO;2-S"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2020.3029946"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2019.2897583"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tnnls.2022.3201511"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2419013"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2009.2026285"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2013.2289910"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(00)00062-9"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2014.12.001"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2013.08.007"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2015.05.019"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.7b05189"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2019.104193"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.cherd.2012.06.010"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.8b00697"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2020.09.006"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.psep.2019.12.010"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2019.06.004"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.3390\/pr9020300"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-021-87818-3"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-020-16238-0"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1002\/aic.690440812"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1111\/j.2517-6161.1996.tb02080.x"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1007\/s10107-015-0892-3"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2273477"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/0098-1354(93)80018-I"},{"key":"ref36","article-title":"Benchmark simulation model no. 1, (BSM1). IWA Taskgroup on benchmarking of control strategies for WWTPs","author":"Alex","year":"2008"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.8b00591"},{"issue":"4","key":"ref38","first-page":"298","article-title":"Investigation of decarburization in spring steel production process\u2014Part I: Experiments","volume":"80","author":"Li","year":"2009","journal-title":"Steel Res. Int."}],"container-title":["IEEE Transactions on Neural Networks and Learning Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/5962385\/10517792\/10044474.pdf?arnumber=10044474","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,3]],"date-time":"2024-05-03T18:52:48Z","timestamp":1714762368000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10044474\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5]]},"references-count":38,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tnnls.2023.3242361","relation":{},"ISSN":["2162-237X","2162-2388"],"issn-type":[{"value":"2162-237X","type":"print"},{"value":"2162-2388","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,5]]}}}