{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,25]],"date-time":"2026-03-25T05:34:34Z","timestamp":1774416874087,"version":"3.50.1"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2016,7,1]],"date-time":"2016-07-01T00:00:00Z","timestamp":1467331200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2016,7,1]],"date-time":"2016-07-01T00:00:00Z","timestamp":1467331200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2016,7,1]],"date-time":"2016-07-01T00:00:00Z","timestamp":1467331200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2016,7,1]],"date-time":"2016-07-01T00:00:00Z","timestamp":1467331200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000015","name":"DOE","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100000015","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100006224","name":"Argonne National Laboratory","doi-asserted-by":"publisher","award":["3F-30222"],"award-info":[{"award-number":["3F-30222"]}],"id":[{"id":"10.13039\/100006224","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000001","name":"US National Science Foundation","doi-asserted-by":"publisher","award":["DMS-1216318"],"award-info":[{"award-number":["DMS-1216318"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Grid Science"},{"DOI":"10.13039\/100000774","name":"DTRA","doi-asserted-by":"publisher","award":["HDTRA-1-13-1-0021"],"award-info":[{"award-number":["HDTRA-1-13-1-0021"]}],"id":[{"id":"10.13039\/100000774","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Netw. Sci. Eng."],"published-print":{"date-parts":[[2016,7,1]]},"DOI":"10.1109\/tnse.2016.2587484","type":"journal-article","created":{"date-parts":[[2016,7,7]],"date-time":"2016-07-07T20:16:26Z","timestamp":1467922586000},"page":"132-146","source":"Crossref","is-referenced-by-count":45,"title":["Analyzing Vulnerability of Power Systems with Continuous Optimization Formulations"],"prefix":"10.1109","volume":"3","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1631-5878","authenticated-orcid":false,"given":"Taedong","family":"Kim","sequence":"first","affiliation":[]},{"given":"Stephen J.","family":"Wright","sequence":"additional","affiliation":[]},{"given":"Daniel","family":"Bienstock","sequence":"additional","affiliation":[]},{"given":"Sean","family":"Harnett","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISAP.2009.5352849"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2012.12.011"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2013.2256374"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1137\/08073562X"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.cor.2013.06.009"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2013.08.003"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2014.2300695"},{"key":"ref17","article-title":"Report on the August 14, 2003 blackout in the United States and Canada: Causes and recommendations","year":"2004"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/PESGM.2012.6345338"},{"key":"ref19","author":"bergen","year":"1999","journal-title":"Power Systems Analysis"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2008.2004825"},{"key":"ref27","author":"nocedal","year":"2006","journal-title":"Numerical Optimization"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2005.846198"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2008.919243"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2006.08.007"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2009.0098"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1137\/070708275"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2005.851942"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2009.2032232"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2004.825888"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1002\/eej.4391000307"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1137\/0318035"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/nav.3800030109"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s10107-004-0559-y"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1974.293972"},{"key":"ref26","article-title":"Test Circuit (in Russian)","author":"khokhlov","year":"2008"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2010.2051168"}],"container-title":["IEEE Transactions on Network Science and Engineering"],"original-title":[],"link":[{"URL":"http:\/\/ieeexplore.ieee.org\/ielaam\/6488902\/7557100\/7506129-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6488902\/7557100\/07506129.pdf?arnumber=7506129","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,8]],"date-time":"2022-04-08T18:53:57Z","timestamp":1649444037000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7506129\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,7,1]]},"references-count":27,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tnse.2016.2587484","relation":{},"ISSN":["2327-4697"],"issn-type":[{"value":"2327-4697","type":"print"}],"subject":[],"published":{"date-parts":[[2016,7,1]]}}}