{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,8]],"date-time":"2026-04-08T16:27:55Z","timestamp":1775665675104,"version":"3.50.1"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,9,1]],"date-time":"2024-09-01T00:00:00Z","timestamp":1725148800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U2233212"],"award-info":[{"award-number":["U2233212"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62303030"],"award-info":[{"award-number":["62303030"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Beijing Municipal Natural Science Foundation","award":["L221008"],"award-info":[{"award-number":["L221008"]}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2022M710305"],"award-info":[{"award-number":["2022M710305"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004543","name":"China Scholarship Council","doi-asserted-by":"crossref","award":["202206020114"],"award-info":[{"award-number":["202206020114"]}],"id":[{"id":"10.13039\/501100004543","id-type":"DOI","asserted-by":"crossref"}]},{"name":"Outstanding Research Project of Shen Yuan Honors College","award":["230122204"],"award-info":[{"award-number":["230122204"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Netw. Sci. Eng."],"published-print":{"date-parts":[[2024,9]]},"DOI":"10.1109\/tnse.2024.3396469","type":"journal-article","created":{"date-parts":[[2024,5,3]],"date-time":"2024-05-03T18:55:23Z","timestamp":1714762523000},"page":"4093-4105","source":"Crossref","is-referenced-by-count":6,"title":["Resilient Containment Under Time-Varying Networks With Relaxed Graph Robustness"],"prefix":"10.1109","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0009-0005-7587-7274","authenticated-orcid":false,"given":"Zirui","family":"Liao","sequence":"first","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8102-3436","authenticated-orcid":false,"given":"Shaoping","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4475-5195","authenticated-orcid":false,"given":"Jian","family":"Shi","sequence":"additional","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4749-4688","authenticated-orcid":false,"given":"Sofie","family":"Haesaert","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Eindhoven University of Technology, Eindhoven, The Netherlands"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9384-5173","authenticated-orcid":false,"given":"Yuwei","family":"Zhang","sequence":"additional","affiliation":[{"name":"School of Automation Science and Electrical Engineering, Beihang University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4700-1479","authenticated-orcid":false,"given":"Zhiyong","family":"Sun","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Eindhoven University of Technology, Eindhoven, The Netherlands"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNSE.2022.3176214"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2018.2868786"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNSE.2015.2503983"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ast.2023.108605"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2022.3143082"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNSE.2019.2954950"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2020.109004"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2023.3237731"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2012.05.010"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/CDC.2009.5399946"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2019.12.067"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.ast.2022.107909"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2021.3066941"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TNSE.2022.3217536"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2019.2947620"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2019.02.035"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNSE.2020.3025621"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TNSE.2023.3252666"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2018.11.048"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1002\/acs.3408"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2020.3007655"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSAC.2013.130413"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2017.03.008"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCNS.2019.2924235"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2024.3364524"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TNSE.2020.3036755"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCNS.2020.3017922"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TRO.2021.3057220"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2022.110456"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CDC.2016.7798671"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.23919\/ACC.2018.8431573"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ISRCS.2014.6900100"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2019.2954363"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TCNS.2017.2782486"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2019.03.018"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.23919\/ACC.2017.7962962"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/DDCLS.2018.8516075"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2023.3237493"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TCNS.2017.2696364"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2019.2934954"}],"container-title":["IEEE Transactions on Network Science and Engineering"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6488902\/10637788\/10518136.pdf?arnumber=10518136","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,16]],"date-time":"2024-08-16T17:24:40Z","timestamp":1723829080000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10518136\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,9]]},"references-count":40,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tnse.2024.3396469","relation":{},"ISSN":["2327-4697","2334-329X"],"issn-type":[{"value":"2327-4697","type":"electronic"},{"value":"2334-329X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,9]]}}}