{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:01:05Z","timestamp":1740132065292,"version":"3.37.3"},"reference-count":6,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2021,8,1]],"date-time":"2021-08-01T00:00:00Z","timestamp":1627776000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,8,1]],"date-time":"2021-08-01T00:00:00Z","timestamp":1627776000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,8,1]],"date-time":"2021-08-01T00:00:00Z","timestamp":1627776000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001824","name":"Grantov\u00e1 Agentura \u010cesk\u00e9 Republiky","doi-asserted-by":"publisher","award":["GA18-07247S"],"award-info":[{"award-number":["GA18-07247S"]}],"id":[{"id":"10.13039\/501100001824","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Praemium Academiae"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Pattern Anal. Mach. Intell."],"published-print":{"date-parts":[[2021,8,1]]},"DOI":"10.1109\/tpami.2020.3036630","type":"journal-article","created":{"date-parts":[[2020,11,6]],"date-time":"2020-11-06T21:33:17Z","timestamp":1604698397000},"page":"2882-2884","source":"Crossref","is-referenced-by-count":2,"title":["Blur-Invariant Similarity Measurement of Images"],"prefix":"10.1109","volume":"43","author":[{"given":"Matej","family":"Lebl","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6835-4911","authenticated-orcid":false,"given":"Filip","family":"Sroubek","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3747-9214","authenticated-orcid":false,"given":"Jan","family":"Flusser","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1007\/978-3-030-29888-3_28"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1109\/TPAMI.2012.15"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1109\/TIP.2013.2259840"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1109\/TIP.2012.2228498"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1109\/34.927464"},{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1109\/TPAMI.2014.2353644"}],"container-title":["IEEE Transactions on Pattern Analysis and Machine Intelligence"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/34\/9471034\/09250602.pdf?arnumber=9250602","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:49:22Z","timestamp":1652194162000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9250602\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,8,1]]},"references-count":6,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tpami.2020.3036630","relation":{},"ISSN":["0162-8828","2160-9292","1939-3539"],"issn-type":[{"type":"print","value":"0162-8828"},{"type":"electronic","value":"2160-9292"},{"type":"electronic","value":"1939-3539"}],"subject":[],"published":{"date-parts":[[2021,8,1]]}}}