{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:01:42Z","timestamp":1740132102097,"version":"3.37.3"},"reference-count":1,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T00:00:00Z","timestamp":1643673600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T00:00:00Z","timestamp":1643673600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T00:00:00Z","timestamp":1643673600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Pattern Anal. Mach. Intell."],"published-print":{"date-parts":[[2022,2,1]]},"DOI":"10.1109\/tpami.2021.3128797","type":"journal-article","created":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T02:32:01Z","timestamp":1643682721000},"page":"1122-1122","source":"Crossref","is-referenced-by-count":3,"title":["Erratum to \u201cDeep Back-Projection Networks for Single Image Super-Resolution\u201d"],"prefix":"10.1109","volume":"44","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8868-8094","authenticated-orcid":false,"given":"Muhammad","family":"Haris","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Greg","family":"Shakhnarovich","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0240-1065","authenticated-orcid":false,"given":"Norimichi","family":"Ukita","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2020.3002836"}],"container-title":["IEEE Transactions on Pattern Analysis and Machine Intelligence"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/34\/9674188\/09674052.pdf?arnumber=9674052","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,13]],"date-time":"2024-01-13T22:06:33Z","timestamp":1705183593000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9674052\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,2,1]]},"references-count":1,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tpami.2021.3128797","relation":{},"ISSN":["0162-8828","2160-9292","1939-3539"],"issn-type":[{"type":"print","value":"0162-8828"},{"type":"electronic","value":"2160-9292"},{"type":"electronic","value":"1939-3539"}],"subject":[],"published":{"date-parts":[[2022,2,1]]}}}