{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T10:18:06Z","timestamp":1740133086660,"version":"3.37.3"},"reference-count":43,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2017,11,1]],"date-time":"2017-11-01T00:00:00Z","timestamp":1509494400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61672116","61601067","61472052"],"award-info":[{"award-number":["61672116","61601067","61472052"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"National 863 Program","award":["2015AA015304"],"award-info":[{"award-number":["2015AA015304"]}]},{"name":"Chongqing High-Tech Research Program","award":["cstc2016jcyjA0332","cstc2014yykfB40007"],"award-info":[{"award-number":["cstc2016jcyjA0332","cstc2014yykfB40007"]}]},{"name":"Science and Technology Research Program"},{"DOI":"10.13039\/501100007957","name":"Chongqing Municipal Education Commission","doi-asserted-by":"publisher","award":["KJ1704085"],"award-info":[{"award-number":["KJ1704085"]}],"id":[{"id":"10.13039\/501100007957","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100009183","name":"ACM","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100009183","id-type":"DOI","asserted-by":"publisher"}]},{"name":"IEEE"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Parallel Distrib. Syst."],"published-print":{"date-parts":[[2017,11,1]]},"DOI":"10.1109\/tpds.2017.2713780","type":"journal-article","created":{"date-parts":[[2017,6,8]],"date-time":"2017-06-08T18:26:47Z","timestamp":1496946407000},"page":"3089-3099","source":"Crossref","is-referenced-by-count":7,"title":["Building NVRAM-Aware Swapping Through Code Migration in Mobile Devices"],"prefix":"10.1109","volume":"28","author":[{"given":"Kan","family":"Zhong","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3040-2065","authenticated-orcid":false,"given":"Duo","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lingbo","family":"Long","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jinting","family":"Ren","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yang","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Edwin Hsing-Mean","family":"Sha","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2015.7059057"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5456923"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/1555754.1555760"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/2442116.2442127"},{"key":"ref31","first-page":"211","article-title":"SSDAlloc: Hybrid SSD\/RAM memory management made easy","author":"badam","year":"2011","journal-title":"Proc Symp Netw Syst Des Implementation"},{"key":"ref30","first-page":"13","article-title":"FlashVM: Revisiting the virtual memory hierarchy","author":"saxena","year":"2009","journal-title":"Proceedings of the 12th Conference on Hot Topics in Operating Systems"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669116"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.131"},{"key":"ref35","doi-asserted-by":"crossref","first-page":"1450","DOI":"10.1109\/TCAD.2014.2341922","article-title":"Application-specific wear leveling for extending lifetime of phase change memory in embedded systems","volume":"33","author":"liu","year":"2014","journal-title":"IEEE Trans Comput -Aided Des Integr Circuits Syst"},{"key":"ref34","doi-asserted-by":"crossref","first-page":"327","DOI":"10.1145\/2627369.2627667","article-title":"Prolonging PCM lifetime through energy-efficient, segment-aware, and wear-resistant page allocation","author":"khouzani","year":"2014","journal-title":"Proc Int Symp Low Power Electron Des"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/2150976.2151018"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/PACT.2009.30"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/2656045.2656049"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/2627369.2627647"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2512904"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/2830772.2830786"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/2039370.2039420"},{"key":"ref16","first-page":"1519","article-title":"A compression-based area-efficient recovery architecture for nonvolatile processors","author":"wang","year":"2012","journal-title":"Proc Des Autom Test Europe Conf Exhib"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/1555754.1555758"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/1555754.1555759"},{"key":"ref19","first-page":"279","article-title":"Curling-PCM: Application-specific wear leveling for phase change memory based embedded systems","author":"liu","year":"2013","journal-title":"Proc Asia South Pacific Des Autom Conf"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2428692"},{"key":"ref4","first-page":"459","article-title":"A novel Nonvolatile memory with spin torque transfer magnetization switching: Spin-RAM","volume":"459","author":"osomi","year":"2005","journal-title":"Proc IEEE Int Electron Devices Meeting Tech Dig"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/2968478.2968497"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2010.2070050"},{"year":"2015","key":"ref6"},{"key":"ref29","article-title":"Fass: A flash-aware swap system","author":"jung","year":"2005","journal-title":"Proc Int Workshop Softw Support Portable Storage"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/nature06932"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630086"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2012.81"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/2385603.2385607"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/1555754.1555760"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"1305","DOI":"10.7873\/DATE.2015.0760","article-title":"nCode: Limiting Harmful Writes to Emerging Mobile NVRAM through Code Swapping","author":"kan zhong","year":"2015","journal-title":"Design Automation Test in Europe Conference Exhibition (DATE)"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228439"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669157"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669117"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1145\/2742854.2742886"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2009.5090604"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2015.7372545"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2007.377981"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/HPCC-CSS-ICESS.2015.262"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1145\/2429384.2429400"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2012.6176872"}],"container-title":["IEEE Transactions on Parallel and Distributed Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/71\/8063268\/07944530.pdf?arnumber=7944530","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,29]],"date-time":"2022-07-29T09:55:45Z","timestamp":1659088545000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7944530\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,11,1]]},"references-count":43,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tpds.2017.2713780","relation":{},"ISSN":["1045-9219"],"issn-type":[{"type":"print","value":"1045-9219"}],"subject":[],"published":{"date-parts":[[2017,11,1]]}}}