{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,12]],"date-time":"2026-03-12T15:34:01Z","timestamp":1773329641494,"version":"3.50.1"},"reference-count":18,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2009,3,1]],"date-time":"2009-03-01T00:00:00Z","timestamp":1235865600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2009,3]]},"DOI":"10.1109\/tr.2008.2011684","type":"journal-article","created":{"date-parts":[[2009,2,13]],"date-time":"2009-02-13T20:26:56Z","timestamp":1234556816000},"page":"88-97","source":"Crossref","is-referenced-by-count":35,"title":["A Fast and Robust Reliability Evaluation Algorithm for Generalized Multi-State $k$-out-of-$n$ Systems"],"prefix":"10.1109","volume":"58","author":[{"given":"S.V.","family":"Amari","sequence":"first","affiliation":[]},{"given":"M.J.","family":"Zuo","sequence":"additional","affiliation":[]},{"given":"G.","family":"Dill","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2000.816319"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2007.909766"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-84800-131-2_21"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1142\/9789812773760_0013"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1080\/07408170802322655"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-84800-113-8_2"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/1-85233-841-5_1"},{"key":"ref17","author":"trivedi","year":"2001","journal-title":"Probability and Statistics with Reliability Queuing and Computer Science Applications"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4899-3242-6"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/b97596"},{"key":"ref3","author":"kuo","year":"2003","journal-title":"Optimal Reliability Modeling Principles and Applications"},{"key":"ref6","first-page":"581","article-title":"fundamental concepts and relations for reliability analysis of multistate systems","author":"murchland","year":"1975","journal-title":"Reliability and Fault Tree Analysis Theoretical and Applied Aspects of System Reliability (SIAM)"},{"key":"ref5","doi-asserted-by":"crossref","DOI":"10.1142\/5221","author":"lisnianski","year":"2003","journal-title":"Multi-State System Reliability Assessment Optimization and Applications"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1287\/moor.3.4.275"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/24.285107"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2006.874916"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/24.855543"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.2307\/3213425"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/24\/4797896\/04781594.pdf?arnumber=4781594","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:59:35Z","timestamp":1633910375000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4781594\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,3]]},"references-count":18,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2008.2011684","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2009,3]]}}}