{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T10:14:11Z","timestamp":1769940851852,"version":"3.49.0"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2011,3,1]],"date-time":"2011-03-01T00:00:00Z","timestamp":1298937600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2011,3]]},"DOI":"10.1109\/tr.2010.2087430","type":"journal-article","created":{"date-parts":[[2010,11,23]],"date-time":"2010-11-23T18:05:39Z","timestamp":1290535539000},"page":"234-245","source":"Crossref","is-referenced-by-count":67,"title":["Optimal Burn-In Policy for Highly Reliable Products Using Gamma Degradation Process"],"prefix":"10.1109","volume":"60","author":[{"given":"Chih-Chun","family":"Tsai","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sheng-Tsaing","family":"Tseng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Narayanaswamy","family":"Balakrishnan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2005.847275"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1984.5221760"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1983.12763"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1023\/B:LIDA.0000036389.14073.dd"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.2307\/1266262"},{"key":"ref15","doi-asserted-by":"crossref","first-page":"172","DOI":"10.1080\/07408179008964170","article-title":"Burn-in models and methods: A review","volume":"22","author":"leemis","year":"1990","journal-title":"IIE Transactions"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/0895-7177(93)90135-L"},{"key":"ref17","author":"meeker","year":"1998","journal-title":"Statistical Methods for Reliability Data"},{"key":"ref18","doi-asserted-by":"crossref","DOI":"10.1002\/9780470316795","author":"nelson","year":"1990","journal-title":"Accelerated Testing Statistical Models Test Plans and Data Analysis"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1080\/05695558208974600"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2007.897073"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/S0377-2217(99)00308-2"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1961.10489946"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/nav.20240"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/BF02124750"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1520-6750(199710)44:7<655::AID-NAV4>3.0.CO;2-B"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1002\/nav.10067"},{"key":"ref7","author":"jensen","year":"1982","journal-title":"Burn-in an engineering approach to the Design and Analysis of Burn-in Procedures"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/nav.20135"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1080\/714044435"},{"key":"ref1","author":"bagdonavicius","year":"2002","journal-title":"Accelerated Life Models Modeling and Statistical Analysis"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/s10985-005-5237-8"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1214\/ss\/1177010132"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2006.874937"},{"key":"ref24","first-page":"329","article-title":"Optimal burn-in time for highly reliable products","volume":"8","author":"tseng","year":"2001","journal-title":"International Journal of Industrial Engineering"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1080\/07408170490507701"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1214\/07-AOAS156"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1002\/nav.10042"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/24\/5721872\/05638165.pdf?arnumber=5638165","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,4,1]],"date-time":"2024-04-01T12:31:08Z","timestamp":1711974668000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5638165\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,3]]},"references-count":28,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2010.2087430","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,3]]}}}