{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,16]],"date-time":"2025-10-16T06:51:05Z","timestamp":1760597465644},"reference-count":12,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2011,3,1]],"date-time":"2011-03-01T00:00:00Z","timestamp":1298937600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2011,3]]},"DOI":"10.1109\/tr.2010.2088730","type":"journal-article","created":{"date-parts":[[2010,11,23]],"date-time":"2010-11-23T21:02:06Z","timestamp":1290546126000},"page":"295-304","source":"Crossref","is-referenced-by-count":30,"title":["A General Model for Start-Up Demonstration Tests"],"prefix":"10.1109","volume":"60","author":[{"given":"Amos E.","family":"Gera","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2008.2006290"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/24.376531"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2006.12.009"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2010.2041975"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"186","DOI":"10.1080\/00224065.2005.11980320","article-title":"Start-up demonstration tests based on consecutive successes and total failures","volume":"37","author":"smith","year":"2005","journal-title":"Journal of Quality Technology"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"523","DOI":"10.1109\/TR.2004.837524","article-title":"Combined k-out-of-n:G, and <ref_formula><tex Notation=\"TeX\">${\\rm k}_{\\rm c}$<\/tex><\/ref_formula>-out-of-n:G systems","volume":"53","author":"gera","year":"2004","journal-title":"IEEE Trans Reliability"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"119","DOI":"10.1080\/00224065.1993.11979434","article-title":"Statistical inference from start-up demonstration test data","volume":"25","author":"viveros","year":"1993","journal-title":"Journal of Quality Technology"},{"key":"ref8","author":"kuo","year":"2003","journal-title":"Optimal Reliability Modeling Principles and Applications"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"103","DOI":"10.1080\/00224065.1983.11978856","article-title":"evaluation of a start-up demonstration test","volume":"15","author":"hahn","year":"1983","journal-title":"Journal of Quality Technology"},{"key":"ref2","author":"balakrishnan","year":"2002","journal-title":"Runs and Scans With Applications"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/S0377-2217(02)00872-X"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1023\/A:1004101402897"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/24\/5721872\/05638630.pdf?arnumber=5638630","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:47:17Z","timestamp":1633909637000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5638630\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,3]]},"references-count":12,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2010.2088730","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,3]]}}}