{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,12]],"date-time":"2026-04-12T15:28:30Z","timestamp":1776007710188,"version":"3.50.1"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2011,3,1]],"date-time":"2011-03-01T00:00:00Z","timestamp":1298937600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2011,3]]},"DOI":"10.1109\/tr.2010.2103590","type":"journal-article","created":{"date-parts":[[2011,1,10]],"date-time":"2011-01-10T20:53:59Z","timestamp":1294692839000},"page":"331-340","source":"Crossref","is-referenced-by-count":179,"title":["A Unified Approach for Developing Software Reliability Growth Models in the Presence of Imperfect Debugging and Error Generation"],"prefix":"10.1109","volume":"60","author":[{"given":"P. K.","family":"Kapur","sequence":"first","affiliation":[]},{"given":"H.","family":"Pham","sequence":"additional","affiliation":[]},{"given":"Sameer","family":"Anand","sequence":"additional","affiliation":[]},{"given":"Kalpana","family":"Yadav","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1080\/00207729608929237"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/24.784276"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2007.909760"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4613-1067-9"},{"key":"ref31","first-page":"587","author":"sehgal","year":"2007","journal-title":"Quality Reliability and Infocom Technology"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.2001.989472"},{"key":"ref37","doi-asserted-by":"crossref","first-page":"114","DOI":"10.1109\/TSMCA.2003.812597","article-title":"Considering fault removal efficiency in software reliability assessment","volume":"33","author":"zhang","year":"2003","journal-title":"IEEE Trans on Systems Man and Cybernetics-Part A Systems and Humans"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1983.5221735"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.1992.285846"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1002\/qre.827"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISSRE.1996.558886"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2008.2007982"},{"key":"ref11","first-page":"34","article-title":"Log-logistic software reliability growth model","author":"gokhale","year":"1998","journal-title":"Proceedings of High Insurance System Engineering (HASE 98)"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2003.1183936"},{"key":"ref13","first-page":"119","article-title":"An infinite server queuing model considering time distribution of fault isolation process for software reliability assessment","volume":"102","author":"inoue","year":"2002","journal-title":"IEICE Technical Report [Reliability]"},{"key":"ref14","doi-asserted-by":"crossref","first-page":"291","DOI":"10.1049\/sej.1992.0030","article-title":"a software reliability growth model for an error-removal phenomenon","volume":"7","author":"kapur","year":"1992","journal-title":"Software Engineering Journal"},{"key":"ref15","doi-asserted-by":"crossref","DOI":"10.1142\/4011","author":"kapur","year":"1999","journal-title":"Contributions to Hardware and Software Reliability"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2010.2103590"},{"key":"ref17","first-page":"62","article-title":"Effect of introduction of faults and imperfect debugging on release time","author":"kapur","year":"2008","journal-title":"Ratio Mathematica"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"295","DOI":"10.1051\/ro\/1990240302951","article-title":"Optimal software release policies for software reliability growth model under imperfect debugging","volume":"24","author":"kapur","year":"1990","journal-title":"RAIRO"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1137\/0906053"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1142\/S0218539397000199"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/APSEC.2004.29"},{"key":"ref27","doi-asserted-by":"crossref","DOI":"10.1007\/1-84628-295-0","author":"pham","year":"2006","journal-title":"System Software Reliability"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.2307\/1428006"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1979.5220566"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/800027.808456"},{"key":"ref5","first-page":"71","author":"farr","year":"1996","journal-title":"Software Reliability Modeling Survey"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1023\/B:SQJO.0000034709.63615.8b"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1985.232177"},{"key":"ref2","doi-asserted-by":"crossref","DOI":"10.21236\/ADA086334","author":"brooks","year":"1980","journal-title":"Analysis of Discrete Software Reliability Models-Technical Report"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/BFb0034288"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1023\/A:1018923329647"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2005.12.006"},{"key":"ref22","first-page":"267","author":"musa","year":"1987","journal-title":"Software Reliability Measurement Prediction Application"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.1986.6312915"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.1989.714425"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/24.963126"},{"key":"ref23","first-page":"44","author":"ohba","year":"1984","journal-title":"Stochastic Models in Reliability Theory"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/32.624305"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1147\/rd.284.0428"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/24\/5721872\/05685288.pdf?arnumber=5685288","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:46:53Z","timestamp":1633909613000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5685288\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,3]]},"references-count":41,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2010.2103590","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,3]]}}}