{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,26]],"date-time":"2026-06-26T15:14:58Z","timestamp":1782486898856,"version":"3.54.5"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2011,3,1]],"date-time":"2011-03-01T00:00:00Z","timestamp":1298937600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2011,3]]},"DOI":"10.1109\/tr.2010.2104210","type":"journal-article","created":{"date-parts":[[2011,1,21]],"date-time":"2011-01-21T20:03:47Z","timestamp":1295640227000},"page":"80-87","source":"Crossref","is-referenced-by-count":60,"title":["Multi-State Reliability Systems Under Discrete Time Semi-Markovian Hypothesis"],"prefix":"10.1109","volume":"60","author":[{"given":"Ourania","family":"Chryssaphinou","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Nikolaos","family":"Limnios","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sonia","family":"Malefaki","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1080\/07408179908969917"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1080\/03610920701713328"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-24808-8_9"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.2307\/3213425"},{"key":"ref14","author":"janssen","year":"2007","journal-title":"Semi-Markov Risk Models for Finance Insurance and Reliability"},{"key":"ref15","author":"limnios","year":"2001","journal-title":"Statistics for Industry and Technology"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1142\/9789812795250_0030"},{"key":"ref17","first-page":"21","article-title":"Nonparametric estimation of performance and performability for semi-markov processes","volume":"2","author":"limnios","year":"2006","journal-title":"International Journal of Performability Engineering"},{"key":"ref18","doi-asserted-by":"crossref","DOI":"10.1142\/5221","author":"lisnianski","year":"2003","journal-title":"Multi-State System Reliability"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2003.818714"},{"key":"ref4","author":"barbu","year":"2006","journal-title":"Probability Statistics and Modeling in Public Health Special volume in honor of professor Marvin Zelen"},{"key":"ref3","author":"barbu","year":"2004","journal-title":"Parametric and Semiparametric Models With Applications to Reliability Survival Analysis and Quality of Life"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177704147"},{"key":"ref5","author":"barbu","year":"2008","journal-title":"Lecture Notes in Statistics"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1287\/moor.3.4.275"},{"key":"ref7","author":"barlow","year":"1975","journal-title":"Statistical Theory of Reliability and Life Testing Probability Models"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1081\/STA-200037923"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1142\/S0218539303001007"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/0951-8320(93)90078-D"},{"key":"ref20","first-page":"581","article-title":"Fundamental concepts and relations for reliability analysis of multi-state systems and fault tree analysis","author":"murchland","year":"1975","journal-title":"Theoretical and Applied Aspects of System Reliability"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1239\/jap\/1197908825"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/S0378-3758(02)00308-7"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2004.08.023"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1969.292458"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/0026-2714(92)90015-D"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1214\/aop\/1176995096"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/24\/5721872\/05696795.pdf?arnumber=5696795","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:46:41Z","timestamp":1633909601000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5696795\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,3]]},"references-count":26,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2010.2104210","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,3]]}}}