{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,8]],"date-time":"2026-01-08T19:10:32Z","timestamp":1767899432405,"version":"3.49.0"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2011,6,1]],"date-time":"2011-06-01T00:00:00Z","timestamp":1306886400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2011,6]]},"DOI":"10.1109\/tr.2011.2134190","type":"journal-article","created":{"date-parts":[[2011,4,12]],"date-time":"2011-04-12T18:57:31Z","timestamp":1302634651000},"page":"404-414","source":"Crossref","is-referenced-by-count":18,"title":["Approximate Reliability Function Based on Wavelet Latin Hypercube Sampling and Bee Recurrent Neural Network"],"prefix":"10.1109","volume":"60","author":[{"given":"Wei-Chang","family":"Yeh","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jack C. P.","family":"Su","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tsung-Jung","family":"Hsieh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mingchang","family":"Chih","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sin-Long","family":"Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","author":"patterson","year":"1996","journal-title":"Artificial Neural Networks Theory and Applications"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(97)00061-0"},{"key":"ref31","doi-asserted-by":"crossref","DOI":"10.7551\/mitpress\/5236.001.0001","author":"rumelhart","year":"1986","journal-title":"Parallel Distributed Processing Exploration in the Microstructures of Cognition"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/S0951-8320(03)00117-0"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/24.85455"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1980.5220696"},{"key":"ref12","article-title":"An artificial bee colony (ABC) algorithm for numeric function optimization","author":"basturk","year":"0","journal-title":"In IEEE Swarm Intelligence Symposium 2006"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.2307\/1271432"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1006\/acha.1993.1005"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.2005.1556346"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.2307\/2291282"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/0378-3758(94)90115-5"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/S0378-3758(00)00105-1"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1214\/ss\/1177012413"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2008.09.001"},{"key":"ref4","author":"colbourn","year":"1987","journal-title":"The Combinatorics of Network Reliability"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.amc.2009.03.090"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"322","DOI":"10.1109\/TR.2008.920864","article-title":"A new sample-based approach to predict system performance reliability","volume":"57","author":"son","year":"2008","journal-title":"IEEE Trans Reliability"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2004.05.002"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TNN.2005.853437"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-003-1560-y"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-77600-0_31"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2005.12.006"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2008.2011854"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/24.87124"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2009.02.021"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1989.10488474"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.optcom.2004.01.017"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1115\/1.1561044"},{"key":"ref24","doi-asserted-by":"crossref","first-page":"511","DOI":"10.1016\/j.physa.2005.12.048","article-title":"The reaction of stock markets to crashes and events: A comparison study between emerging and mature markets using wavelet transforms","volume":"368","author":"adel","year":"2006","journal-title":"Physica A Statistical Mechanics and its Applications"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.stamet.2005.07.002"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2007.05.007"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s10898-007-9149-x"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/24\/5779932\/05746639.pdf?arnumber=5746639","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:52:12Z","timestamp":1633909932000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5746639\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,6]]},"references-count":33,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tr.2011.2134190","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,6]]}}}