{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T18:24:31Z","timestamp":1761675871960},"reference-count":43,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2011,9,1]],"date-time":"2011-09-01T00:00:00Z","timestamp":1314835200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2011,9]]},"DOI":"10.1109\/tr.2011.2161032","type":"journal-article","created":{"date-parts":[[2011,7,20]],"date-time":"2011-07-20T20:22:27Z","timestamp":1311193347000},"page":"538-549","source":"Crossref","is-referenced-by-count":33,"title":["Using Bayesian Networks to Accurately Calculate the Reliability of Complementary Metal Oxide Semiconductor Gates"],"prefix":"10.1109","volume":"60","author":[{"given":"Walid","family":"Ibrahim","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Valeriu","family":"Beiu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","year":"0","journal-title":"Predictive Technology Model (PTM)"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2008.2001030"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS.2009.5290448"},{"key":"ref32","article-title":"On CMOS circuit reliability from the MOSFETs and the input vectors","author":"beiu","year":"2009","journal-title":"Proc Int Conf Dependable Syst Netw (DSN)"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt.2008.0133"},{"key":"ref30","first-page":"254","article-title":"Architectures for reliable computing with unreliable nanodevices","author":"nicoli","year":"2001","journal-title":"Proc IEEE Conf Nanotech"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681586"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1145\/1859204.1859227"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-68282-2"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/IIT.2009.5413631"},{"key":"ref10","article-title":"Special Issue on Nano-electronic Circuits and Nano-architectures","volume":"54","year":"2007","journal-title":"IEEE Trans Circ Syst I"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.884077"},{"key":"ref11","article-title":"Special Issue on Reliable Computing","volume":"3","year":"2007","journal-title":"ACM J Emerging Technol Comput Syst"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2007.903188"},{"key":"ref13","first-page":"1","author":"beiu","year":"2007","journal-title":"Handbook of Nano and Molecular Electronics"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2008.4484862"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/NANOARCH.2009.5226360"},{"key":"ref16","article-title":"Computing inexactly: A potential approach to living with the constraints of the nanoscale","author":"tiwari","year":"2009","journal-title":"Proc Intl Symp Nanoscale Arch (NanoArch)"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2006.886737"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/NANO.2010.5697892"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2009.07.023"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2005.1465256"},{"key":"ref4","year":"2009","journal-title":"International Technology Roadmap for Semiconductors (ITRS) SEMATECH"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1155\/2010\/460312"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2003.1225959"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/anie.200502358"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2007.915203"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/5.752518"},{"key":"ref8","year":"2006","journal-title":"Proc Int Conf Computer Design (ICCAD)"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1002\/cphc.200600260"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/NANOEL.2006.1609776"},{"key":"ref9","article-title":"Special Section on Reliability Studies on Nanotechnology","volume":"56","year":"2007","journal-title":"IEEE Trans Reliab"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/NANO.2004.1392441"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cdt:20045106"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2010.07.154"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/NANO.2006.1717013"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2010.2059036"},{"key":"ref24","first-page":"59","article-title":"Evaluating circuit reliability under probabilistic gate-level fault models","author":"patel","year":"2003","journal-title":"Proc Intl Workshop Logic Synthesis (IWLS)"},{"key":"ref41","year":"0","journal-title":"Reliable and Variability Tolerant System-on-a-chip Design in More-Moore Technologies"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/1530873.1530882"},{"key":"ref26","first-page":"34","article-title":"Reliability of <ref_formula> <tex Notation=\"TeX\">$n$<\/tex><\/ref_formula>-bit nanotechnology adder","author":"hnninen","year":"2008","journal-title":"Proc IEEE Computer Soc Annu Symp VLSI (ISVLSI)"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2010.2066573"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.47"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/24\/6006660\/05953545.pdf?arnumber=5953545","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:47:55Z","timestamp":1633909675000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5953545\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,9]]},"references-count":43,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tr.2011.2161032","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2011,9]]}}}