{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,23]],"date-time":"2026-02-23T15:36:11Z","timestamp":1771860971741,"version":"3.50.1"},"reference-count":14,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2012,3,1]],"date-time":"2012-03-01T00:00:00Z","timestamp":1330560000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2012,3]]},"DOI":"10.1109\/tr.2011.2170259","type":"journal-article","created":{"date-parts":[[2011,10,14]],"date-time":"2011-10-14T21:16:39Z","timestamp":1318626999000},"page":"41-49","source":"Crossref","is-referenced-by-count":16,"title":["A Proposed Measure of Residual Life of Live Components of a Coherent System"],"prefix":"10.1109","volume":"61","author":[{"given":"Narayanaswamy","family":"Balakrishnan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Majid","family":"Asadi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1239\/jap\/1269610828"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1985.5221935"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-34675-5"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.jspi.2009.07.029"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.spl.2009.12.029"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1520-6750(199908)46:5<507::AID-NAV4>3.0.CO;2-D"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.jspi.2006.01.012"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/asmb.715"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2006.879652"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1239\/jap\/1231340236"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.spl.2004.12.017"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2008.2007161"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2006.874934"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/nav.20285"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/24\/6159254\/06046107.pdf?arnumber=6046107","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:47:24Z","timestamp":1633909644000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6046107\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,3]]},"references-count":14,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tr.2011.2170259","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2012,3]]}}}