{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,11]],"date-time":"2025-11-11T13:02:59Z","timestamp":1762866179118},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2013,9,1]],"date-time":"2013-09-01T00:00:00Z","timestamp":1377993600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2013,9]]},"DOI":"10.1109\/tr.2013.2270413","type":"journal-article","created":{"date-parts":[[2013,7,1]],"date-time":"2013-07-01T18:35:36Z","timestamp":1372703736000},"page":"618-627","source":"Crossref","is-referenced-by-count":19,"title":["Optimal Allocation of Connecting Elements in Phase Mission Linear Consecutively-Connected Systems"],"prefix":"10.1109","volume":"62","author":[{"given":"Gregory","family":"Levitin","sequence":"first","affiliation":[]},{"given":"Liudong","family":"Xing","sequence":"additional","affiliation":[]},{"given":"Yuanshun","family":"Dai","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref38","article-title":"Impact of energy depletion and reliability on wireless sensor network connectivity","author":"lee","year":"2004","journal-title":"Proc SPIE Defense Security"},{"key":"ref33","author":"leemis","year":"1995","journal-title":"Reliability?Probabilistic Models and Statistical Methods"},{"key":"ref32","author":"modarres","year":"2010","journal-title":"Reliability Engineering and Risk Analysis A Practical Guide"},{"key":"ref31","doi-asserted-by":"crossref","first-page":"293","DOI":"10.1115\/1.4010337","article-title":"A statistical distribution function of wide applicability","volume":"18","author":"weibull","year":"1951","journal-title":"ASME Journal of Applied Mechanic"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2003.814918"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/INSS.2007.4297397"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/S0925-4005(03)00262-4"},{"key":"ref35","author":"christou","year":"1993","journal-title":"Electromigration and Electronic Device Degradation"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1080\/15501320802299853"},{"key":"ref10","author":"levitin","year":"2005","journal-title":"Universal Generating Function in Reliability Analysis and Optimization"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/0026-2714(96)00004-2"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2003.809655"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/24.249576"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/24.765927"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2006.890900"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1981.5221156"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1969.5216341"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1973.5216037"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-84800-131-2_23"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/0378-7796(94)00909-N"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1982.5221423"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/0925-5273(95)00059-3"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1981.5220981"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/24.406595"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/S0951-8320(03)00136-4"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1987.5222467"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1002\/qre.418"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/0951-8320(94)90009-4"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.1980.5220921"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/1-85233-841-5_3"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/24.46467"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2192060"},{"key":"ref22","doi-asserted-by":"crossref","DOI":"10.1002\/9780470316795","author":"nelson","year":"1990","journal-title":"Accelerated Testing Statistical Models Test Plans and Data Analyses"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/0951-8320(88)90114-7"},{"key":"ref24","author":"goldberg","year":"1989","journal-title":"Genetic Algor Search Optimiz Mach Learn"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2008.4925836"},{"key":"ref26","year":"2007","journal-title":"Computational Intelligence in Reliability Engineering Evolutionary Techniques in Reliability Analysis and Optimization"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2005.11.007"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/6587537\/06550025.pdf?arnumber=6550025","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,2]],"date-time":"2023-07-02T20:25:07Z","timestamp":1688329507000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6550025\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,9]]},"references-count":38,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tr.2013.2270413","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2013,9]]}}}