{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,23]],"date-time":"2026-04-23T17:31:52Z","timestamp":1776965512911,"version":"3.51.4"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2014,9,1]],"date-time":"2014-09-01T00:00:00Z","timestamp":1409529600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/100007567","name":"City University of Hong Kong","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007567","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Rel."],"published-print":{"date-parts":[[2014,9]]},"DOI":"10.1109\/tr.2014.2315773","type":"journal-article","created":{"date-parts":[[2014,4,10]],"date-time":"2014-04-10T14:02:23Z","timestamp":1397138543000},"page":"750-763","source":"Crossref","is-referenced-by-count":185,"title":["Accelerated Degradation Test Planning Using the Inverse Gaussian Process"],"prefix":"10.1109","volume":"63","author":[{"given":"Zhi-Sheng","family":"Ye","sequence":"first","affiliation":[]},{"given":"Liang-Peng","family":"Chen","sequence":"additional","affiliation":[]},{"given":"Loon Ching","family":"Tang","sequence":"additional","affiliation":[]},{"given":"Min","family":"Xie","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2010.2040769"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2004.1285462"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2005.863811"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/AMR.118-120.404"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2011.5754481"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.7469\/JKSQM.2012.40.2.117"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1080\/02664760903406488"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2009.2033734"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2194351"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1198\/TECH.2009.08197"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1214\/ss\/1177010132"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.2307\/1269661"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2010.2103710"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmva.2008.12.007"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2006.02.002"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1998.10485191"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2194190"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2005.847247"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2170115"},{"key":"ref20","volume":"314","author":"meeker","year":"1998","journal-title":"Statistical Methods for Reliability Data"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2013.830074"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1080\/03461238.1968.10413264"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1002\/9780470117880"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2010.11.018"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2012.03.028"},{"key":"ref25","volume":"95","author":"chhikara","year":"1988","journal-title":"The Inverse Gaussian Distribution Theory Methodology and Applications"}],"container-title":["IEEE Transactions on Reliability"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/24\/6887384\/06786428.pdf?arnumber=6786428","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:50:30Z","timestamp":1641988230000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6786428\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,9]]},"references-count":26,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tr.2014.2315773","relation":{},"ISSN":["0018-9529","1558-1721"],"issn-type":[{"value":"0018-9529","type":"print"},{"value":"1558-1721","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,9]]}}}